For the Inventor, By the Inventor

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San Jose, CA, United States of America

Pdf Solutions, Incorporated

USPTO Granted Patents = 203

% Expired Patents = 60.1

Trademarks = 18

Forward Citations = 2,393

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146 inventors (with patents filed for the assignee):

Christopher Hess (111 out of 111 patents)

Dennis Ciplickas (104 out of 104 patents)

Larg H Weiland (96 out of 96 patents)

4. Jonathan Haigh (95 out of 95 patents)

5. Indranil De (92 out of 115 patents)

6. Sherry F Lee (91 out of 91 patents)

7. Jeremy Cheng (90 out of 114 patents)

8. Tomasz Brozek (90 out of 90 patents)

9. John Kibarian (90 out of 90 patents)

10. Kimon Michaels (90 out of 90 patents)

11. Sheng-Che Lin (87 out of 87 patents)

12. Stephen Lam (86 out of 86 patents)

13. Hans Eisenmann (86 out of 87 patents)

14. Rakesh Vallishayee (86 out of 86 patents)

15. Vyacheslav Rovner (84 out of 84 patents)

Core Competencies:

Electrical Measurement

Semiconductor Processes

Machine Learning

Wafer Analysis

Root Cause Analysis

Failure Detection

Characterization Vehicles

Integrated Circuits

Chip Design

Process Control

Yield Prediction

Test Structures

203 patents: Sort by Forward Citations

1. 12431333 - Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cell (2025-09-30),

2. 12429520 - Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block (2025-09-30),

3. 12416663 - Embedded system to characterize BTI degradation effects in MOSFETs (2025-09-16),

4. 12229945 - Wafer bin map based root cause analysis (2025-02-18),

5. 12223012 - Machine learning variable selection and root cause discovery by cumulative prediction (2025-02-11),

6. 12038802 - Collaborative learning model for semiconductor applications (2024-07-16),

7. 12038476 - Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block (2024-07-16),

8. 12020897 - Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cell (2024-06-25),

9. 11972987 - Die level product modeling without die level input data (2024-04-30),

10. 11972552 - Abnormal wafer image classification (2024-04-30),

11. 11775714 - Rational decision-making tool for semiconductor processes (2023-10-03),

12. 11763446 - Wafer bin map based root cause analysis (2023-09-19),

13. 11687439 - Automatic window generation for process trace (2023-06-27),

14. 11668746 - Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block (2023-06-06),

15. 11640328 - Predicting equipment fail mode from process trace (2023-05-02),

Company Overview

Pdf Solutions, Incorporated, based in San Jose, California, specializes in non-contact electrical measurements, focusing on enhancing semiconductor processes. The company leverages advanced technologies in electrical measurement, machine learning, and wafer analysis to provide solutions for root cause analysis, failure detection, and characterization of integrated circuits. Their innovative approach aims to improve the efficiency and reliability of semiconductor manufacturing, addressing critical challenges in the industry.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

203 Patents

#65 in San Jose, CA

#445 in California

#2,039 in US

#4,178 in the World

San Jose, CA, United States of America

Pdf Solutions, Incorporated

Forward Citations = 2,393

146 inventors:

Christopher Hess (111 out of 111 patents)

Dennis Ciplickas (104 out of 104 patents)

Larg H Weiland (96 out of 96 patents)

4. Jonathan Haigh (95 out of 95 patents)

5. Indranil De (92 out of 115 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Pdf Solutions, Incorporated. Retrieved from https://idiyas.com/company/pdf-solutions

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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