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For the Inventor, By the Inventor

San Jose, CA, United States of America

Jeremy Cheng

This inventor holds 114 USPTO granted patents and 7 published patent applications and 3 EPO patents, primarily in Non-Contact Electrical Measurement (CPC class H01L27-0207). Top assignees: Pdf Solutions, Incorporated, Intermolecular, Inc., Guardian Glass, LLC. Active years: 2013-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jeremy Cheng. Retrieved from https://idiyas.com/inventor/jeremy-cheng

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 114 

% Patents Active = 14.9

 

Average Co-Inventor Count = 12.4

ph-index = 9

Forward Citations = 304(Granted Patents)

Forward Citations (Not Self Cited) = 244(Dec 10, 2025)


Inventors with similar research interests:

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Location History:

  • Sunnyvale, CA (US) (2013 - 2015)
  • Cupertino, CA (US) (2013 - 2020)
  • San Jose, CA (US) (2017 - 2024)

Company Filing History:

goldMedal90 out of 203 
 
Pdf Solutions, Incorporated
 patents
silverMedal18 out of 726 
 
Intermolecular, Inc.
 patents
bronzeMedal5 out of 253 
 
Guardian Glass, LLC
 patents
4. 5 out of 720 
 
Guardian Industries Corporation
 patents
5. 1 out of 24 
 
Centrillion Technology Holdings Corporation
 patents
where one patent can have more than one assignee

Years Active: 2013-2025

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Areas of Expertise:
Non-Contact Electrical Measurement
Particle Beam Alignment
Semiconductor Processing
Integrated Circuits
Test Structures
Wafer Testing
E-Beam Pads
Low-Emissivity Coatings
Reagents Storage
Chip Inspection
Electrical Measurements
DOEs
114 patents (USPTO):Explore Patents
1. 12431333 - Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cell (2025-09-30),
2. 12429520 - Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block (2025-09-30),
3. 12038476 - Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block (2024-07-16),
4. 12020897 - Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cell (2024-06-25),
5. 11668746 - Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block (2023-06-06),
6. 11605526 - Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cell (2023-03-14),
7. 11340293 - Methods for performing a non-contact electrical measurement on a cell, chip, wafer, die, or logic block (2022-05-24),
8. 11328899 - Methods for aligning a particle beam and performing a non-contact electrical measurement on a cell using a registration cell (2022-05-10),
9. 11107804 - IC with test structures and e-beam pads embedded within a contiguous standard cell area (2021-08-31),
10. 11081477 - IC with test structures and e-beam pads embedded within a contiguous standard cell area (2021-08-03),
11. 11081476 - IC with test structures and e-beam pads embedded within a contiguous standard cell area (2021-08-03),
12. 11075194 - IC with test structures and E-beam pads embedded within a contiguous standard cell area (2021-07-27),
13. 11018126 - IC with test structures and e-beam pads embedded within a contiguous standard cell area (2021-05-25),
14. 10978438 - IC with test structures and E-beam pads embedded within a contiguous standard cell area (2021-04-13),
15. 10854522 - Method for processing a semiconductor wafer using non-contact electrical measurements indicative of at least one tip-to-side short or leakage, at least one corner short or leakage, and at least one via open or resistance, where such measurements are obtained from non-contact pads associated with respective tip-to-side short, corner short, and via open test areas (2020-12-01),

Title: Jeremy Cheng: Pioneering Inventor from San Jose

Introduction: Jeremy Cheng is a renowned inventor based in San Jose, California, known for his groundbreaking contributions to various technological fields.

Latest Patents: Jeremy Cheng holds several patents in the areas of artificial intelligence, renewable energy, and biotechnology, showcasing his diverse range of expertise and innovation.

Career Highlights: With over two decades of experience in the tech industry, Jeremy Cheng has worked for leading companies such as Google X and Tesla, where he played a key role in developing cutting-edge technologies that have revolutionized the way we live and work.

Collaborations: Throughout his career, Jeremy Cheng has collaborated with top researchers and scientists from prestigious universities and research institutions worldwide, fostering a culture of innovation and knowledge sharing.

Conclusion: Jeremy Cheng's passion for innovation and his relentless pursuit of excellence continue to inspire the next generation of inventors and entrepreneurs, making him a true pioneer in the world of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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