Average Co-Inventor Count = 12.44
ph-index = 9
The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.
Company Filing History:
1. Pdf Solutions, Incorporated (90 from 203 patents)
2. Intermolecular, Inc. (18 from 726 patents)
3. Guardian Industries Corporation (5 from 720 patents)
4. Guardian Glass, LLC (5 from 252 patents)
5. Centrillion Technology Holdings Corporation (1 from 24 patents)
114 patents:
1. 12431333 - Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cell
2. 12429520 - Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block
3. 12038476 - Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block
4. 12020897 - Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cell
5. 11668746 - Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block
6. 11605526 - Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cell
7. 11340293 - Methods for performing a non-contact electrical measurement on a cell, chip, wafer, die, or logic block
8. 11328899 - Methods for aligning a particle beam and performing a non-contact electrical measurement on a cell using a registration cell
9. 11107804 - IC with test structures and e-beam pads embedded within a contiguous standard cell area
10. 11081476 - IC with test structures and e-beam pads embedded within a contiguous standard cell area
11. 11081477 - IC with test structures and e-beam pads embedded within a contiguous standard cell area
12. 11075194 - IC with test structures and E-beam pads embedded within a contiguous standard cell area
13. 11018126 - IC with test structures and e-beam pads embedded within a contiguous standard cell area
14. 10978438 - IC with test structures and E-beam pads embedded within a contiguous standard cell area
15. 10854522 - Method for processing a semiconductor wafer using non-contact electrical measurements indicative of at least one tip-to-side short or leakage, at least one corner short or leakage, and at least one via open or resistance, where such measurements are obtained from non-contact pads associated with respective tip-to-side short, corner short, and via open test areas