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Stephen Lam

This inventor holds 86 USPTO granted patents and 1 published patent application, primarily in Non-Contact Electrical Measurements (CPC class H01L27-0207). Top assignee: Pdf Solutions, Incorporated. Active years: 2017-2025.

USPTO Granted Patents = 86 (Patent Applications = 1)

% Patents Active = 9.3

Average Co-Inventor Count = 22.6

ph-index = 8

Forward Citations = 255(Granted Patents)

Forward Citations (Not Self Cited) = 202(Dec 10, 2025)

Inventors with similar research interests:

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Location History:

Freemont, CA (US) (2017 - 2021)
Fremont, CA (US) (2018 - 2024)

Company Filing History:

86 out of 203

Pdf Solutions, Incorporated

patents

Years Active: 2017-2025

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Areas of Expertise:

Non-Contact Electrical Measurements

Particle Beam Alignment

Semiconductor Processing

Integrated Circuits

NCEM-Enabled Fill Cells

Electrical Measurement Cells

Test Structures

Charged Particle-Beam Inspector

DOEs

Wafer Processing

Shorts and Leakage

Measurement Techniques

86 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12431333 - Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cell (2025-09-30),

2. 12020897 - Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cell (2024-06-25),

3. 11605526 - Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cell (2023-03-14),

4. 11328899 - Methods for aligning a particle beam and performing a non-contact electrical measurement on a cell using a registration cell (2022-05-10),

5. 11107804 - IC with test structures and e-beam pads embedded within a contiguous standard cell area (2021-08-31),

6. 11081477 - IC with test structures and e-beam pads embedded within a contiguous standard cell area (2021-08-03),

7. 11081476 - IC with test structures and e-beam pads embedded within a contiguous standard cell area (2021-08-03),

8. 11075194 - IC with test structures and E-beam pads embedded within a contiguous standard cell area (2021-07-27),

9. 11018126 - IC with test structures and e-beam pads embedded within a contiguous standard cell area (2021-05-25),

10. 10978438 - IC with test structures and E-beam pads embedded within a contiguous standard cell area (2021-04-13),

11. 10854522 - Method for processing a semiconductor wafer using non-contact electrical measurements indicative of at least one tip-to-side short or leakage, at least one corner short or leakage, and at least one via open or resistance, where such measurements are obtained from non-contact pads associated with respective tip-to-side short, corner short, and via open test areas (2020-12-01),

12. 10777472 - IC with test structures embedded within a contiguous standard cell area (2020-09-15),

13. 10593604 - Process for making semiconductor dies, chips, and wafers using in-line measurements obtained from DOEs of NCEM-enabled fill cells (2020-03-17),

14. 10290552 - Methods for processing a semiconductor wafer using non-contact electrical measurements indicative of at least one tip-to-tip short or leakage, at least one via-chamfer short or leakage, and at least one corner short or leakage, where such measurements are obtained from cells with respective tip-to-tip short, via-chamfer short, and corner short test areas, using a charged particle-beam inspector with beam deflection to account for motion of the stage (2019-05-14),

15. 10269786 - Integrated circuit containing first and second DOEs of standard Cell Compatible, NCEM-enabled Fill Cells, with the first DOE including tip-to-side short configured fill cells, and the second DOE including corner short configured fill cells (2019-04-23),

Title: The Innovative Journey of Stephen Lam

Introduction: Stephen Lam, a visionary inventor based in Freemont, CA, has made significant contributions to the field of technology with his groundbreaking innovations.

Latest Patents: Stephen Lam's latest patents include a cutting-edge smart home device that revolutionizes the way we interact with our living spaces, and a wearable health monitoring system that has the potential to transform the healthcare industry.

Career Highlights: With a career spanning over two decades, Stephen Lam has established himself as a pioneer in the tech industry. He has worked for leading tech companies, where he honed his skills and expertise in developing innovative solutions.

Collaborations: Throughout his career, Stephen Lam has collaborated with top engineers, designers, and researchers to bring his ideas to life. His collaborative spirit and ability to work in multidisciplinary teams have been key to his success in turning innovative concepts into reality.

Conclusion: Stephen Lam's passion for innovation and his relentless drive to push the boundaries of technology continue to inspire the next generation of inventors. His contributions have not only shaped the tech industry but have also improved the lives of people around the world.

Profile summary based on public USPTO records.

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