IDiyas

For the Inventor, By the Inventor

Morgan Hill, CA, United States of America

Tomasz Brozek

USPTO Granted Patents = 90

Average Co-Inventor Count = 10.4

ph-index = 9

Forward Citations = 454(Granted Patents)

DiyaCoin DiyaCoin = 0.19 


Inventors with similar research interests:


Location History:

  • San Jose, CA (US) (2011)
  • Sunnyvale, CA (US) (2009 - 2013)
  • Morgan Hill, CA (US) (2017 - 2021)

Company Filing History:

goldMedal90 out of 203 
 
Pdf Solutions, Incorporated
 patents

Years Active: 2009-2025

where 'Filed Patents' based on already Granted Patents

90 patents (USPTO):
1. 12416663 - Embedded system to characterize BTI degradation effects in MOSFETs (2025-09-16),
2. 11107804 - IC with test structures and e-beam pads embedded within a contiguous standard cell area (2021-08-31),
3. 11081477 - IC with test structures and e-beam pads embedded within a contiguous standard cell area (2021-08-03),
4. 11081476 - IC with test structures and e-beam pads embedded within a contiguous standard cell area (2021-08-03),
5. 11075194 - IC with test structures and E-beam pads embedded within a contiguous standard cell area (2021-07-27),
6. 11018126 - IC with test structures and e-beam pads embedded within a contiguous standard cell area (2021-05-25),
7. 10978438 - IC with test structures and E-beam pads embedded within a contiguous standard cell area (2021-04-13),
8. 10854522 - Method for processing a semiconductor wafer using non-contact electrical measurements indicative of at least one tip-to-side short or leakage, at least one corner short or leakage, and at least one via open or resistance, where such measurements are obtained from non-contact pads associated with respective tip-to-side short, corner short, and via open test areas (2020-12-01),
9. 10852337 - Test structures for measuring silicon thickness in fully depleted silicon-on-insulator technologies (2020-12-01),
10. 10777472 - IC with test structures embedded within a contiguous standard cell area (2020-09-15),
11. 10768222 - Method and apparatus for direct testing and characterization of a three dimensional semiconductor memory structure (2020-09-08),
12. 10643735 - Passive array test structure for cross-point memory characterization (2020-05-05),
13. 10593604 - Process for making semiconductor dies, chips, and wafers using in-line measurements obtained from DOEs of NCEM-enabled fill cells (2020-03-17),
14. 10290552 - Methods for processing a semiconductor wafer using non-contact electrical measurements indicative of at least one tip-to-tip short or leakage, at least one via-chamfer short or leakage, and at least one corner short or leakage, where such measurements are obtained from cells with respective tip-to-tip short, via-chamfer short, and corner short test areas, using a charged particle-beam inspector with beam deflection to account for motion of the stage (2019-05-14),
15. 10269786 - Integrated circuit containing first and second DOEs of standard Cell Compatible, NCEM-enabled Fill Cells, with the first DOE including tip-to-side short configured fill cells, and the second DOE including corner short configured fill cells (2019-04-23),

Title: The Innovative Journey of Tomasz Brozek

Introduction: Tomasz Brozek is a visionary inventor based in Morgan Hill, California. With a passion for pushing the boundaries of technology, he has made significant contributions to the field of innovation.

Latest Patents: Tomasz Brozek holds several patents in various technological domains, showcasing his versatility and creativity in inventing cutting-edge solutions.

Career Highlights: Throughout his career, Tomasz Brozek has demonstrated a keen ability to identify gaps in the market and develop innovative products to address them. His dedication to research and development has led to the successful commercialization of several groundbreaking inventions.

Collaborations: Tomasz Brozek has collaborated with leading tech companies and research institutions to further his innovative projects. His ability to work effectively in multidisciplinary teams has been instrumental in bringing his ideas to life.

Conclusion: Tomasz Brozek's relentless pursuit of innovation and his commitment to pushing the boundaries of technology make him a standout inventor in the field. His contributions continue to inspire the next generation of inventors and shape the future of technology.

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