The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2020

Filed:

Jul. 11, 2018
Applicant:

Pdf Solutions, Inc., San Jose, CA (US);

Inventors:

Tomasz Brozek, Morgan Hill, CA (US);

Christopher Hess, Belmont, CA (US);

Rakesh Vallishayee, San Jose, CA (US);

Meindert Lunenborg, St Gely du Fesc, FR;

Hendrik Schneider, San Jose, CA (US);

Yuan Yu, San Jose, CA (US);

Amit Joag, San Jose, CA (US);

SiewHoon Ng, San Jose, CA (US);

Assignee:

PDF Solutions, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/44 (2006.01); G11C 29/52 (2006.01); G11C 16/14 (2006.01); G11C 29/56 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G11C 29/44 (2013.01); G11C 16/14 (2013.01); G11C 29/52 (2013.01); G11C 29/56 (2013.01); G11C 2029/0401 (2013.01);
Abstract

An apparatus and method for testing two-terminal memory elements organized as a cross-point memory array. The apparatus allows functional testing of two-terminal memory elements organized as a cross-point memory array, and built in a short flow manufacturing process. The proposed apparatus substantially eliminates the use of any type of additional active or passive switches, selectors, or decoders. A large number of memory elements of various memory types including planar (two dimensional) or three dimensional memory structures can be tested without the need of manufacturing selectors or running the full flow process.


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