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For the Inventor, By the Inventor

Belmont, CA, United States of America

Christopher Hess

USPTO Granted Patents = 111 

Average Co-Inventor Count = 11.5

ph-index = 12

Forward Citations = 1,063(Granted Patents)

Forward Citations (Not Self Cited) = 787(Dec 10, 2025)


Inventors with similar research interests:


Location History:

  • San Ramon, CA (US) (2002 - 2010)
  • San Carlos, CA (US) (2008 - 2014)
  • Belmont, CA (US) (2016 - 2024)

Company Filing History:

goldMedal111 out of 203 
 
Pdf Solutions, Incorporated
 patents

Years Active: 2002-2025

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Areas of Expertise:
Non-Contact Electrical Measurement
Integrated Circuits
Mosfet Characterization
Semiconductor Wafer Processing
Test Structures
Ncem-Enabled Fill Cells
Passive Array Test Structures
Charged Particle-Beam Inspection
Tip-To-Side Short Detection
Via Open Detection
Cross-Point Memory Characterization
Electrical Measurement Techniques
111 patents (USPTO):Explore Patents
1. 12429520 - Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block (2025-09-30),
2. 12416663 - Embedded system to characterize BTI degradation effects in MOSFETs (2025-09-16),
3. 12038476 - Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block (2024-07-16),
4. 11668746 - Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block (2023-06-06),
5. 11340293 - Methods for performing a non-contact electrical measurement on a cell, chip, wafer, die, or logic block (2022-05-24),
6. 11107804 - IC with test structures and e-beam pads embedded within a contiguous standard cell area (2021-08-31),
7. 11081477 - IC with test structures and e-beam pads embedded within a contiguous standard cell area (2021-08-03),
8. 11081476 - IC with test structures and e-beam pads embedded within a contiguous standard cell area (2021-08-03),
9. 11075194 - IC with test structures and E-beam pads embedded within a contiguous standard cell area (2021-07-27),
10. 11018126 - IC with test structures and e-beam pads embedded within a contiguous standard cell area (2021-05-25),
11. 10978438 - IC with test structures and E-beam pads embedded within a contiguous standard cell area (2021-04-13),
12. 10854522 - Method for processing a semiconductor wafer using non-contact electrical measurements indicative of at least one tip-to-side short or leakage, at least one corner short or leakage, and at least one via open or resistance, where such measurements are obtained from non-contact pads associated with respective tip-to-side short, corner short, and via open test areas (2020-12-01),
13. 10777472 - IC with test structures embedded within a contiguous standard cell area (2020-09-15),
14. 10643735 - Passive array test structure for cross-point memory characterization (2020-05-05),
15. 10593604 - Process for making semiconductor dies, chips, and wafers using in-line measurements obtained from DOEs of NCEM-enabled fill cells (2020-03-17),

As a specialist in innovations, inventions, inventors, patent attorneys, assignees, and patents, I'd like to provide you with an insightful article about the accomplished inventor Christopher Hess.

Title: The Ingenious Mind of Christopher Hess: A Pioneering Figure in Non-Contact Electrical Measurement

Introduction:

Christopher Hess, a prolific inventor based in Belmont, CA, has made significant contributions to the field of non-contact electrical measurement (NCEM), boasting a remarkable portfolio of 108 patents.

Latest Patents:

Among his latest patents are revolutionary systems, devices, and methods for performing non-contact electrical measurements on cells, chips, wafers, dies, or logic blocks. These innovations enable NCEMs on NCEM-enabled cell vehicles, even while in motion, aligning electron beams with precision using position information.

Career Highlights:

Christopher Hess is associated with Pdf Solutions, Incorporated, a leading company in the tech industry. His expertise and innovative spirit have been instrumental in advancing NCEM technologies and reshaping the landscape of electrical measurements.

Collaborations:

Throughout his career, Hess has collaborated with accomplished peers like Dennis Ciplickas and Larg H Weiland, fostering a culture of innovation and excellence within his professional network.

Conclusion:

In conclusion, Christopher Hess stands as a trailblazer in the domain of non-contact electrical measurement, with an impressive track record of patents and a relentless drive to push the boundaries of technological possibilities.

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