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For the Inventor, By the Inventor

Dennis Ciplickas

San Jose, CA, United States of America

Dennis Ciplickas

LinkedIn
USPTO Granted Patents = 104 

Average Co-Inventor Count = 14.5

ph-index = 11

Forward Citations = 941(Granted Patents)

Forward Citations (Not Self Cited) = 752(Dec 10, 2025)


Inventors with similar research interests:


Company Filing History:

goldMedal104 out of 203 
 
Pdf Solutions, Incorporated
 patents

Years Active: 2004-2025

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Areas of Expertise:
Non-Contact Electrical Measurement
Integrated Circuits
Semiconductor Applications
Test Structures
Charged Particle-Beam Inspection
Ncem-Enabled Fill Cells
Wafer Processing
Short Circuit Detection
Leakage Measurement
Doe (Design Of Experiments)
Chip Manufacturing
Electrical Testing
104 patents (USPTO):Explore Patents
1. 12429520 - Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block (2025-09-30),
2. 12038802 - Collaborative learning model for semiconductor applications (2024-07-16),
3. 12038476 - Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block (2024-07-16),
4. 11668746 - Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block (2023-06-06),
5. 11340293 - Methods for performing a non-contact electrical measurement on a cell, chip, wafer, die, or logic block (2022-05-24),
6. 11107804 - IC with test structures and e-beam pads embedded within a contiguous standard cell area (2021-08-31),
7. 11081477 - IC with test structures and e-beam pads embedded within a contiguous standard cell area (2021-08-03),
8. 11081476 - IC with test structures and e-beam pads embedded within a contiguous standard cell area (2021-08-03),
9. 11075194 - IC with test structures and E-beam pads embedded within a contiguous standard cell area (2021-07-27),
10. 11018126 - IC with test structures and e-beam pads embedded within a contiguous standard cell area (2021-05-25),
11. 10978438 - IC with test structures and E-beam pads embedded within a contiguous standard cell area (2021-04-13),
12. 10854522 - Method for processing a semiconductor wafer using non-contact electrical measurements indicative of at least one tip-to-side short or leakage, at least one corner short or leakage, and at least one via open or resistance, where such measurements are obtained from non-contact pads associated with respective tip-to-side short, corner short, and via open test areas (2020-12-01),
13. 10777472 - IC with test structures embedded within a contiguous standard cell area (2020-09-15),
14. 10593604 - Process for making semiconductor dies, chips, and wafers using in-line measurements obtained from DOEs of NCEM-enabled fill cells (2020-03-17),
15. 10290552 - Methods for processing a semiconductor wafer using non-contact electrical measurements indicative of at least one tip-to-tip short or leakage, at least one via-chamfer short or leakage, and at least one corner short or leakage, where such measurements are obtained from cells with respective tip-to-tip short, via-chamfer short, and corner short test areas, using a charged particle-beam inspector with beam deflection to account for motion of the stage (2019-05-14),

Title: The Inventor Profile of Dennis Ciplickas

Introduction: Dennis Ciplickas is a renowned inventor based in San Jose, California. With a passion for innovation and problem-solving, he has made significant contributions to various fields through his inventive spirit.

Latest Patents: Dennis Ciplickas holds several patents in the areas of technology and consumer electronics, showcasing his expertise in creating cutting-edge solutions for everyday challenges.

Career Highlights: Throughout his career, Dennis Ciplickas has worked with leading tech companies, where he has been instrumental in developing groundbreaking products that have revolutionized the industry. His innovative approach and attention to detail have set him apart as a visionary inventor.

Collaborations: Dennis Ciplickas has collaborated with top researchers, engineers, and designers to bring his ideas to life. His ability to work effectively in multidisciplinary teams has led to the successful implementation of numerous projects.

Conclusion: In conclusion, Dennis Ciplickas is a prolific inventor with a remarkable track record of turning ideas into reality. His dedication to innovation and creativity continues to inspire the next generation of inventors.

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