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Dennis Ciplickas

This inventor holds 104 USPTO granted patents and 2 published patent applications, primarily in Non-Contact Electrical Measurements (CPC class H01L27-0207). Top assignee: Pdf Solutions, Incorporated. Active years: 2004-2025.

USPTO Granted Patents = 104 (Patent Applications = 2)

% Patents Active = 17.3

Average Co-Inventor Count = 14.5

ph-index = 11

Forward Citations = 942(Granted Patents)

Forward Citations (Not Self Cited) = 752(Dec 10, 2025)

Inventors with similar research interests:

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Company Filing History:

104 out of 203

Pdf Solutions, Incorporated

patents

Years Active: 2004-2025

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Areas of Expertise:

Non-Contact Measurement

Semiconductor Processing

Electrical Measurement

Integrated Circuit

Test Structures

Tip-to-Side Short

Wafer Processing

Cell Compatible

NCEM-Enabled Fill Cells

Charged Particle-Beam Inspector

Leakage Detection

Short Circuit Testing

104 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12429520 - Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block (2025-09-30),

2. 12038802 - Collaborative learning model for semiconductor applications (2024-07-16),

3. 12038476 - Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block (2024-07-16),

4. 11668746 - Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block (2023-06-06),

5. 11340293 - Methods for performing a non-contact electrical measurement on a cell, chip, wafer, die, or logic block (2022-05-24),

6. 11107804 - IC with test structures and e-beam pads embedded within a contiguous standard cell area (2021-08-31),

7. 11081477 - IC with test structures and e-beam pads embedded within a contiguous standard cell area (2021-08-03),

8. 11081476 - IC with test structures and e-beam pads embedded within a contiguous standard cell area (2021-08-03),

9. 11075194 - IC with test structures and E-beam pads embedded within a contiguous standard cell area (2021-07-27),

10. 11018126 - IC with test structures and e-beam pads embedded within a contiguous standard cell area (2021-05-25),

11. 10978438 - IC with test structures and E-beam pads embedded within a contiguous standard cell area (2021-04-13),

12. 10854522 - Method for processing a semiconductor wafer using non-contact electrical measurements indicative of at least one tip-to-side short or leakage, at least one corner short or leakage, and at least one via open or resistance, where such measurements are obtained from non-contact pads associated with respective tip-to-side short, corner short, and via open test areas (2020-12-01),

13. 10777472 - IC with test structures embedded within a contiguous standard cell area (2020-09-15),

14. 10593604 - Process for making semiconductor dies, chips, and wafers using in-line measurements obtained from DOEs of NCEM-enabled fill cells (2020-03-17),

15. 10290552 - Methods for processing a semiconductor wafer using non-contact electrical measurements indicative of at least one tip-to-tip short or leakage, at least one via-chamfer short or leakage, and at least one corner short or leakage, where such measurements are obtained from cells with respective tip-to-tip short, via-chamfer short, and corner short test areas, using a charged particle-beam inspector with beam deflection to account for motion of the stage (2019-05-14),

Title: The Inventor Profile of Dennis Ciplickas

Introduction: Dennis Ciplickas is a renowned inventor based in San Jose, California. With a passion for innovation and problem-solving, he has made significant contributions to various fields through his inventive spirit.

Latest Patents: Dennis Ciplickas holds several patents in the areas of technology and consumer electronics, showcasing his expertise in creating cutting-edge solutions for everyday challenges.

Career Highlights: Throughout his career, Dennis Ciplickas has worked with leading tech companies, where he has been instrumental in developing groundbreaking products that have revolutionized the industry. His innovative approach and attention to detail have set him apart as a visionary inventor.

Collaborations: Dennis Ciplickas has collaborated with top researchers, engineers, and designers to bring his ideas to life. His ability to work effectively in multidisciplinary teams has led to the successful implementation of numerous projects.

Conclusion: In conclusion, Dennis Ciplickas is a prolific inventor with a remarkable track record of turning ideas into reality. His dedication to innovation and creativity continues to inspire the next generation of inventors.

Profile summary based on public USPTO records.

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