The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2024
Filed:
Apr. 22, 2021
Applicant:
Pdf Solutions, Inc., Santa Clara, CA (US);
Inventors:
Tomonori Honda, Santa Clara, CA (US);
Richard Burch, McKinney, TX (US);
Qing Zhu, Rowlett, TX (US);
Jeffrey Drue David, San Jose, CA (US);
Assignee:
PDF Solutions, Inc., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2022.01); G06F 18/2415 (2023.01); G06F 18/2431 (2023.01); G06N 5/04 (2023.01); G06N 20/00 (2019.01); G06T 7/00 (2017.01); G06V 10/44 (2022.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06F 18/2415 (2023.01); G06F 18/2431 (2023.01); G06N 5/04 (2013.01); G06N 20/00 (2019.01); G06V 10/454 (2022.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01); G06T 2207/20076 (2013.01); G06T 2207/30148 (2013.01);
Abstract
A semiconductor image classifier. Convolution functions are applied to modify the wafer images in order to extract key information about the image. The modified images are condensed then processed through a series of pairwise classifiers, each classifier configured to determine that the image is more like one of the pair than the other. Probabilities from each classifier are collected to form a prediction for each image.