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For the Inventor, By the Inventor

Santa Clara, CA, United States of America

Tomonori Honda

USPTO Granted Patents = 12 

Average Co-Inventor Count = 4.1

ph-index = 3

Forward Citations = 18(Granted Patents)


Company Filing History:

goldMedal12 out of 203 
 
Pdf Solutions, Incorporated
 patents

Years Active: 2020-2025

where 'Filed Patents' based on already Granted Patents

12 patents (USPTO):
1. 12229945 - Wafer bin map based root cause analysis (2025-02-18),
2. 12223012 - Machine learning variable selection and root cause discovery by cumulative prediction (2025-02-11),
3. 12038802 - Collaborative learning model for semiconductor applications (2024-07-16),
4. 11972552 - Abnormal wafer image classification (2024-04-30),
5. 11775714 - Rational decision-making tool for semiconductor processes (2023-10-03),
6. 11763446 - Wafer bin map based root cause analysis (2023-09-19),
7. 11609812 - Anomalous equipment trace detection and classification (2023-03-21),
8. 11295993 - Maintenance scheduling for semiconductor manufacturing equipment (2022-04-05),
9. 11029673 - Generating robust machine learning predictions for semiconductor manufacturing processes (2021-06-08),
10. 11029359 - Failure detection and classsification using sensor data and/or measurement data (2021-06-08),
11. 11022642 - Semiconductor yield prediction (2021-06-01),
12. 10777470 - Selective inclusion/exclusion of semiconductor chips in accelerated failure tests (2020-09-15),

Title: Innovations of Tomonori Honda

Introduction

Tomonori Honda is a prominent inventor based in Santa Clara, CA (US). He has made significant contributions to the field of technology, holding a total of 12 patents. His work focuses on improving processes and methodologies in semiconductor manufacturing.

Latest Patents

One of his latest patents is titled "Wafer bin map based root cause analysis." This invention provides a template for assigning the most probable root causes for wafer defects. The bin map data for a subject wafer can be compared with bin map data for prior wafers to identify similar issues. A probability can be determined as to whether the same root cause should be applied to the subject wafer, and if so, the wafer can be labeled with that root cause accordingly. Another notable patent is "Machine learning variable selection and root cause discovery by cumulative prediction." This invention utilizes a sequence of models that accumulates r-squared values for an increasing number of variables to quantify the importance of each variable in predicting a targeted yield or parametric response.

Career Highlights

Tomonori Honda is currently employed at Pdf Solutions, Incorporated, where he continues to innovate and develop new technologies. His work has had a significant impact on the semiconductor industry, enhancing the efficiency and effectiveness of manufacturing processes.

Collaborations

He collaborates with talented individuals such as Jeffrey Drue David and Lin Lee Cheong, contributing to a dynamic and innovative work environment.

Conclusion

Tomonori Honda's contributions to technology and innovation are noteworthy, particularly in the realm of semiconductor manufacturing. His patents reflect a commitment to improving processes and addressing challenges in the industry.

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