The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2024

Filed:

Oct. 16, 2020
Applicant:

Pdf Solutions, Inc., Santa Clara, CA (US);

Inventors:

Richard Burch, McKinney, TX (US);

Qing Zhu, Rowlett, TX (US);

Jonathan Holt, Sachse, TX (US);

Assignee:

PDF Solutions, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/66 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
H01L 22/20 (2013.01); G06N 20/00 (2019.01); H01L 22/14 (2013.01);
Abstract

A machine learning model for each die for imputing process control parameters at the die. The model is based on wafer sort parametric measurements at multiple test sites across the entire wafer, as well as yield results for the wafer. This allows for a better analysis of outlier spatial patterns leading to improved yield results.


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