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Mountain View, CA, United States of America

Indranil De

This inventor holds 115 USPTO granted patents and 9 published patent applications, primarily in Non-Contact Electrical Measurement (CPC class H01L27-0207). Top assignees: Pdf Solutions, Incorporated, Intermolecular, Inc., Kla-Tencor Technologies Corporation. Active years: 2005-2025.

USPTO Granted Patents = 115 (Patent Applications = 9)

% Patents Active = 16.5

Average Co-Inventor Count = 9.5

ph-index = 10

Forward Citations = 582(Granted Patents)

Forward Citations (Not Self Cited) = 289(Dec 10, 2025)

Inventors with similar research interests:

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Location History:

Palo Alto, CA (US) (2009)
Fremont, CA (US) (2013 - 2014)
San Jose, CA (US) (2005 - 2017)
Mountian View, CA (US) (2017 - 2019)
Mountain View, CA (US) (2010 - 2021)
Alameda, CA (US) (2022 - 2024)

Company Filing History:

92 out of 203

Pdf Solutions, Incorporated

Kla-Tencor Technologies Corporation

Kla Tencor Corporation

patents

where one patent can have more than one assignee

Years Active: 2005-2025

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Areas of Expertise:

Non-Contact Electrical Measurement

Particle Beam Alignment

Semiconductor Wafer Processing

Integrated Circuits

Test Structures

Fill Cells

DOEs

E-Beam Pads

Shorts and Leakage

Chip Design

Wafer Manufacturing

Electrical Measurements

115 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12431333 - Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cell (2025-09-30),

2. 12429520 - Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block (2025-09-30),

3. 12038476 - Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block (2024-07-16),

4. 12020897 - Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cell (2024-06-25),

5. 11668746 - Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block (2023-06-06),

6. 11605526 - Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cell (2023-03-14),

7. 11340293 - Methods for performing a non-contact electrical measurement on a cell, chip, wafer, die, or logic block (2022-05-24),

8. 11328899 - Methods for aligning a particle beam and performing a non-contact electrical measurement on a cell using a registration cell (2022-05-10),

9. 11107804 - IC with test structures and e-beam pads embedded within a contiguous standard cell area (2021-08-31),

10. 11081477 - IC with test structures and e-beam pads embedded within a contiguous standard cell area (2021-08-03),

11. 11081476 - IC with test structures and e-beam pads embedded within a contiguous standard cell area (2021-08-03),

12. 11075194 - IC with test structures and E-beam pads embedded within a contiguous standard cell area (2021-07-27),

13. 11018126 - IC with test structures and e-beam pads embedded within a contiguous standard cell area (2021-05-25),

14. 10978438 - IC with test structures and E-beam pads embedded within a contiguous standard cell area (2021-04-13),

15. 10854522 - Method for processing a semiconductor wafer using non-contact electrical measurements indicative of at least one tip-to-side short or leakage, at least one corner short or leakage, and at least one via open or resistance, where such measurements are obtained from non-contact pads associated with respective tip-to-side short, corner short, and via open test areas (2020-12-01),

Title: Inventor Indranil De: Pioneering Innovations in Mountain View

Introduction: Indranil De is a visionary inventor based in Mountain View, CA, known for his groundbreaking contributions to the field of technology and beyond.

Latest Patents: Indranil De holds several patents in the areas of artificial intelligence, machine learning, and renewable energy technologies, showcasing his versatility and forward-thinking approach.

Career Highlights: With a career spanning over two decades, Indranil De has worked with leading tech companies, research institutions, and universities, driving innovation and pushing the boundaries of what is possible.

Collaborations: Throughout his career, Indranil De has collaborated with top researchers, engineers, and scientists from around the world, fostering a culture of creativity and excellence in all his projects.

Conclusion: Indranil De's passion for innovation, coupled with his relentless drive to solve complex challenges, cements his status as a trailblazing inventor shaping the future of technology.

Profile summary based on public USPTO records.

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