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Milpitas, CA, United States of America

Kla-Tencor Technologies Corporation

Calculating rank

USPTO Granted Patents = 641

% Expired Patents = 25.7

EPO Patents = 28

Trademarks = 11

Forward Citations = 13,009

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634 inventors (with patents filed for the assignee):

Ady Levy (55 out of 85 patents)

Michael E Adel (39 out of 87 patents)

Mehrdad Nikoonahad (39 out of 69 patents)

4. Christopher F Bevis (38 out of 54 patents)

5. John Fielden (36 out of 142 patents)

6. David Lewis Adler (35 out of 75 patents)

7. Dan Wack (33 out of 37 patents)

8. Mehdi Vaez-Iravani (30 out of 110 patents)

9. Gary Janik (30 out of 43 patents)

10. Mark Ghinovker (30 out of 84 patents)

11. Yung-Ho Alex Chuang (28 out of 162 patents)

12. Kyle A Brown (28 out of 37 patents)

13. Walter Dean Mieher (26 out of 43 patents)

14. Gary Bultman (24 out of 26 patents)

15. J Joseph Armstrong (22 out of 68 patents)

Core Competencies:

Wafer Inspection

Defect Classification

Lithography Processes

Overlay Measurement

Optical Imaging

EUV Source

Substrate Topography

Defect Detection

Metrology Target Design

Chemical Etching

Process Window Analysis

Measurement Systems

641 patents: Sort by Forward Citations

1. 11348222 - Methods and systems for inspection of wafers and reticles using designer intent data (2022-05-31),

2. 11204330 - Systems and methods for inspection of a specimen (2021-12-21),

3. 10713771 - Methods and systems for inspection of wafers and reticles using designer intent data (2020-07-14),

4. 9401014 - Methods and systems for utilizing design data in combination with inspection data (2016-07-26),

5. 9188974 - Methods for improved monitor and control of lithography processes (2015-11-17),

6. 9068917 - Systems and methods for inspection of a specimen (2015-06-30),

7. 9053833 - DC high-voltage super-radiant free-electron based EUV source (2015-06-09),

8. 9052494 - Optical imaging system with catoptric objective; broadband objective with mirror; and refractive lenses and broadband optical imaging system having two or more imaging paths (2015-06-09),

9. 9037280 - Computer-implemented methods for performing one or more defect-related functions (2015-05-19),

10. 9002497 - Methods and systems for inspection of wafers and reticles using designer intent data (2015-04-07),

11. 8924014 - Dual scanning stage (2014-12-30),

12. 8923600 - Methods and systems for utilizing design data in combination with inspection data (2014-12-30),

13. 8831767 - Methods and systems for monitoring a parameter of a measurement device during polishing, damage to a specimen during polishing, or a characteristic of a polishing pad or tool (2014-09-09),

14. 8768665 - Site based quantification of substrate topography and its relation to lithography defocus and overlay (2014-07-01),

15. 8765496 - Methods and systems for measuring a characteristic of a substrate or preparing a substrate for analysis (2014-07-01),

Company Overview

Kla-Tencor Technologies Corporation, headquartered in Milpitas, California, specializes in semiconductor inspection and metrology solutions. The company focuses on advanced technologies for wafer inspection, defect classification, and lithography processes, ensuring high precision in semiconductor manufacturing. Its expertise extends to overlay measurement, optical imaging, and substrate topography, enabling effective defect detection and enhancing yield in semiconductor production. KLA plays a crucial role in the evolution of the semiconductor industry, supporting innovation and efficiency.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Nov 3 2026

641 Patents

#11 in Milpitas, CA

#175 in California

#786 in US

#1,549 in the World

Milpitas, CA, United States of America

Kla-Tencor Technologies Corporation

Forward Citations = 13,009

634 inventors:

Ady Levy (55 out of 85 patents)

Michael E Adel (39 out of 87 patents)

Mehrdad Nikoonahad (39 out of 69 patents)

4. Christopher F Bevis (38 out of 54 patents)

5. John Fielden (36 out of 142 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Kla-Tencor Technologies Corporation. Retrieved from https://idiyas.com/company/kla-tencor-technologies

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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