David Lewis Adler

Title: David Lewis Adler: Innovating X-ray Inspection and PCB Design

Introduction:

David Lewis Adler, a prolific inventor based in San Jose, CA, has made significant contributions to the fields of X-ray inspection and printed circuit board (PCB) design. With an impressive collection of 74 patents, Adler's expertise and ingenuity have revolutionized these domains. This article delves into his latest patents, career highlights, notable collaborations, and the impact of his groundbreaking inventions.

Latest Patents:

Adler's latest patents showcase his commitment to advancing defect detection in devices using X-rays and improving the design process for PCBs.

Methods and systems for detecting defects in devices using X-rays:

This patent reveals an automated high-speed X-ray inspection system capable of generating high-resolution grayscale images. The system identifies elements of interest within the inspected sample and identifies any interfering elements present. By analyzing grayscale value variations, the system determines first features associated with the elements of interest, enabling the identification of defects associated with these elements.

Methods and systems for printed circuit board design based on automatic corrections:

In this patent, Adler introduces a computing system that accesses design data of a printed circuit board. By applying correction rules, the system automatically adjusts parameters associated with the PCB's impedance. These adjustments ensure that the impedance remains independent of layer thickness variations, thereby optimizing the functionality and reliability of the final product.

Career Highlights:

Adler's career highlights exemplify his dedication to innovation and problem-solving in the field of technology.

Companies he worked with:

Adler has contributed his expertise to renowned companies such as KLA-Tencor Technologies Corporation and KLA-Tencor Corporation. These companies are leaders in providing advanced inspection and measurement solutions for semiconductor manufacturing and related industries.

Collaborations:

Throughout his career, Adler has had the opportunity to collaborate with exceptional professionals, including:

1. David J Walker:

As a collaborator, Walker's expertise likely complemented Adler's innovative solutions and contributed to the success of their joint projects. The synergy between these two inventors may have resulted in groundbreaking advancements in X-ray inspection and PCB design.

2. Akella V S Satya:

Another key collaborator, Akella V S Satya, may have shared Adler's passion for developing efficient and accurate inspection systems. Together, they may have combined their knowledge and skills to tackle the challenges facing the industry.

Conclusion:

David Lewis Adler's impressive collection of patents and his contributions to X-ray inspection and PCB design have left a lasting impact on the field of technology. His innovative methodologies and systems have enhanced defect detection processes, ensuring the production of high-quality devices. With his collaborations and career highlights in notable companies, Adler has established himself as a visionary inventor, bringing valuable advancements to the industry.