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Berlin, Germany

Bruker Nano Gmbh

USPTO Granted Patents = 162

EPO Patents = 73

Trademarks = 77

Forward Citations = 341

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183 inventors (with patents filed for the assignee):

Chanmin Su (38 out of 56 patents)

Shuiqing Hu (23 out of 23 patents)

Craig Prater (15 out of 60 patents)

4. Yan Hu (15 out of 15 patents)

5. Ji Ma (12 out of 13 patents)

6. Sergey Osechinskiy (10 out of 10 patents)

7. Jian Shi (10 out of 13 patents)

8. Weijie Wang (9 out of 9 patents)

9. Gregory O Andreev (9 out of 9 patents)

10. Bede Pittenger (9 out of 10 patents)

11. Anthonius Ruiter (8 out of 8 patents)

12. Erik Novak (7 out of 17 patents)

13. Kevin Kjoller (7 out of 33 patents)

14. Stephen C Minne (7 out of 36 patents)

15. Dong Chen Chen (7 out of 38 patents)

Core Competencies:

Silicon Drift Detector

Chemical-Mechanical Polishing

Defect Detection

Imaging Spectropolarimeter

Nanoscale Dynamic Mechanical Analysis

X-Ray Inspection

Atomic Force Microscopy

Metrology Probe

Printed Circuit Board Design

Infrared Spectroscopy

Kikuchi Diffraction

High-Speed Profilometry

162 patents: Sort by Forward Citations

1. 12468052 - Hybrid integrated silicon drift detector and method for fabrication thereof (2025-11-11),

2. 12420374 - Chemical-mechanical polishing system with a potentiostat and pulsed-force applied to a workpiece (2025-09-23),

3. 12307668 - Methods and systems for defects detection and classification using X-rays (2025-05-20),

4. 12306092 - Imaging spectropolarimeter and sample characterization methodology utilizing the same (2025-05-20),

5. 12241911 - Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA) (2025-03-04),

6. 12140571 - Testing assembly including a multiple degree of freedom stage (2024-11-12),

7. 12106867 - Method for scanning a sample by means of X-ray optics and an apparatus for scanning a sample (2024-10-01),

8. 12073535 - Method of processing an EDX/XRF map and a corresponding image processing device (2024-08-27),

9. 12011800 - Chemical-mechanical polishing system with a potentiostat and pulsed-force applied to a workpiece (2024-06-18),

10. 12000802 - Environmental conditioning mechanical test system (2024-06-04),

11. 11964310 - Debris removal from high aspect structures (2024-04-23),

12. 11953517 - Large radius probe (2024-04-09),

13. 11940461 - Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA) (2024-03-26),

14. 11940396 - Method for improving an EBSD/TKD map (2024-03-26),

15. 11815349 - Methods and systems for inspecting integrated circuits based on X-rays (2023-11-14),

BRUKER NANO GMBH is a global leader in scientific instruments and analytical solutions. Their cutting-edge technologies enable scientists and researchers to explore and understand their materials at the molecular and atomic levels. With a wide range of products including atomic force microscopes, optical microscopes, and nanomaterials analysis tools, BRUKER NANO GMBH aims to contribute to scientific advancements and innovative discoveries in numerous fields.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 9 2025

162 Patents

#9 in D-1000 Berlin

#410 in Germany

#4,947 in the World

Berlin, Germany

Bruker Nano Gmbh

Forward Citations = 341

183 inventors:

Chanmin Su (38 out of 56 patents)

Shuiqing Hu (23 out of 23 patents)

Craig Prater (15 out of 60 patents)

4. Yan Hu (15 out of 15 patents)

5. Ji Ma (12 out of 13 patents)

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