Jian Shi

Title: Jian Shi: Innovator in Scanning Probe Microscope Technology

Introduction

Jian Shi, an accomplished inventor based in Ventura, CA, has made significant contributions to the field of microscopy, particularly in scanning probe technologies. With a remarkable portfolio of 13 patents, his work focuses on enhancing the capabilities and stability of atomic force microscopes.

Latest Patents

Among Jian's latest innovations are two notable patents:

1. **Method and apparatus of using peak force tapping mode to measure physical properties of a sample** - This patent describes methods and apparatuses for controlling and stabilizing aspects of a scanning probe microscope (SPM) through Peak Force Tapping (PFT) mode. The invention includes a controller that automatically adjusts the periodic motion of a probe concerning a sample based on instantaneous force measurements. A gain control circuit also tunes the feedback gain to ensure stability during scanning, thus removing the need for expert user intervention in tuning during operation.

2. **Method and apparatus of operating a scanning probe microscope** - Similar to the previous invention, this patent focuses on the automatic control and stabilization of scanning probe microscopes using PFT mode. By controlling probe motion in response to instantaneous force and tuning gain based on separation distances, this innovation facilitates greater stability and accurate scanning, eliminating manual tuning requirements.

Career Highlights

Jian Shi has worked with leading companies in the field, including Bruker Nano GmbH and Veeco Instruments Inc. His experience in these organizations has undoubtedly contributed to his innovative approach and expertise in scientific instrumentation.

Collaborations

Throughout his career, Jian has collaborated with skilled professionals, including Chanmin Su and Ji Ma. These collaborations have likely played a role in the development of his patents and advancements in scanning probe technologies.

Conclusion

Jian Shi's dedication to advancing scanning probe microscope technology through innovative methods has established him as a notable figure in the field. With 13 patents under his name, his work continues to influence the landscape of microscopy, providing improved tools for researchers and scientists worldwide.