The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2014
Filed:
Dec. 01, 2010
Yan HU, Ventura, CA (US);
Shuiqing HU, Santa Barbara, CA (US);
Chanmin Su, Ventura, CA (US);
Jian Shi, Ventura, CA (US);
Ji MA, Thousand Oaks, CA (US);
Yan Hu, Ventura, CA (US);
Shuiqing Hu, Santa Barbara, CA (US);
Chanmin Su, Ventura, CA (US);
Jian Shi, Ventura, CA (US);
Ji Ma, Thousand Oaks, CA (US);
Bruker Nano, Inc., Santa Barbara, CA (US);
Abstract
An improved mode of AFM imaging (Peak Force Tapping (PFT) Mode) uses force as the feedback variable to reduce tip-sample interaction forces while maintaining scan speeds achievable by all existing AFM operating modes. Sample imaging and mechanical property mapping are achieved with improved resolution and high sample throughput, with the mode being workable across varying environments, including gaseous, fluidic and vacuum. Ease of use is facilitated by eliminating the need for an expert user to monitor imaging.