Santa Barbara, CA, United States of America

Shuiqing Hu

USPTO Granted Patents = 23 

 

Average Co-Inventor Count = 4.1

ph-index = 4

Forward Citations = 83(Granted Patents)


Location History:

  • Goleta, CA (US) (2019)
  • Santa Barbara, CA (US) (2014 - 2023)

Company Filing History:


Years Active: 2014-2023

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23 patents (USPTO):Explore Patents

Title: **Innovative Contributions of Inventor Shuiqing Hu**

Introduction

Shuiqing Hu, a distinguished inventor based in Santa Barbara, CA, has made significant contributions to the field of metrology with a total of 23 patents to his name. His innovative work primarily revolves around precision measurement technologies, which are crucial in various industrial applications.

Latest Patents

Among his latest innovations is the "Torsion Wing Probe Assembly," a cutting-edge torsional probe designed for metrology instruments. This advanced probe features a cantilever that is coupled to a support structure via a torsion bar, ensuring that the cantilever, support structure, and arms of the torsion bar maintain substantially the same thickness. Hu's patents also describe methods of manufacturing this torsion probe and a technique for utilizing it to measure photothermal-induced surface displacement of a sample.

Career Highlights

Shuiqing Hu has established himself as a vital asset at Bruker Nano GmbH, where he has pursued his passion for innovation and precision measurement technologies. His extensive patent portfolio reflects a commitment to advancing metrology and addressing complex challenges in the industry.

Collaborations

Throughout his career, Hu has collaborated with talented individuals, including Chanmin Su and Yan Hu, who have supported his efforts in developing new technologies. These collaborative efforts highlight the importance of teamwork in the pursuit of groundbreaking innovations.

Conclusion

As an inventor, Shuiqing Hu's work exemplifies the intersection of creativity and technical expertise. His contributions are paving the way for advancements in metrology, and his legacy will continue to influence the field for years to come.

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