The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2017
Filed:
Dec. 08, 2014
Applicant:
Bruker Nano, Inc., Santa Barbara, CA (US);
Inventors:
Changchun Liu, Goleta, CA (US);
Bede Pittenger, Santa Barbara, CA (US);
Shuiqing Hu, Santa Barbara, CA (US);
Chanmin Su, Ventura, CA (US);
Assignee:
Bruker Nano, Inc., Santa Barbara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 30/06 (2010.01); G01Q 10/06 (2010.01);
U.S. Cl.
CPC ...
G01Q 30/06 (2013.01); G01Q 10/06 (2013.01);
Abstract
An atomic force microscope (AFM) and corresponding method to provide low force (sub-20 pN) AFM control and mechanical property measurement is provided. The preferred embodiments employ real-time false deflection correction/discrimination by adaptively modifying the drive ramp to accommodate to deflection artifacts.