Company Filing History:
Years Active: 2017-2018
Title: Changchun Liu: Innovator in Atomic Force Microscopy
Introduction
Changchun Liu is a prominent inventor based in Goleta, California. He has made significant contributions to the field of atomic force microscopy (AFM), particularly in the area of force measurement techniques. With a total of 2 patents, Liu's work has advanced the capabilities of AFM technology.
Latest Patents
Liu's latest patents focus on force measurement with real-time baseline determination. His innovations provide low force (sub-20 pN) AFM control and mechanical property measurement. The preferred embodiments of his patents employ real-time false deflection correction and discrimination by adaptively modifying the drive ramp to accommodate deflection artifacts. This advancement enhances the precision and reliability of AFM measurements.
Career Highlights
Changchun Liu is currently associated with Bruker Nano GmbH, where he continues to push the boundaries of AFM technology. His expertise in the field has positioned him as a key figure in the development of innovative measurement techniques.
Collaborations
Liu has collaborated with notable colleagues, including Bede Pittenger and Shuiqing Hu. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and advancements in AFM technology.
Conclusion
Changchun Liu's contributions to atomic force microscopy exemplify the impact of innovative thinking in scientific research. His patents and ongoing work at Bruker Nano GmbH continue to shape the future of force measurement techniques.
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