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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10175263 B1

PDFFull Text
Date of Patent:
Jan. 08, 2019

Filed:

Jun. 15, 2016

Sample vessel retention structure for scanning probe microscope

Applicant:

Bruker Nano, Inc., Tuscon, AZ (US);

Inventors:

Charles Meyer, Goleta, CA (US);

Shuiqing Hu, Goleta, CA (US);

James Shaw, Goleta, CA (US);

Chanmin Su, Ventura, CA (US);

Assignee:

Bruker Nano, Inc., Tucson, AZ (US);

Attorney:

Patterson Thuente Pedersen, P.A.

Primary Examiner:

Nicole Ippolito

Assistant Examiner:

Sean Luck

Int. Cl.
CPC ...
G02B 21/02 (2006.01); G01Q 30/14 (2010.01); G01Q 30/16 (2010.01); G01Q 30/02 (2010.01); G01Q 30/20 (2010.01); G02B 21/26 (2006.01); G01Q 30/18 (2010.01);
U.S. Cl.
CPC ...
G01Q 30/025 (2013.01); G01Q 30/18 (2013.01); G01Q 30/20 (2013.01); G02B 21/02 (2013.01); G02B 21/26 (2013.01); G01Q 30/14 (2013.01); G01Q 30/16 (2013.01);
Abstract

A sample vessel retention mechanism for an inverted microscope having an optical objective and a scanning probe microscope (SPM) head. The inverted microscope includes a platform for supporting a sample vessel, in which is formed an aperture sized to provide a passage for the objective of the inverted microscope to approach the sample vessel from below. The retention mechanism provides a vacuum region formed in the platform, with the vacuum region being barometrically coupled with a vacuum generator. Establishment of a vacuum in the vacuum region prevents or substantially reduces oscillation of the sample vessel floor in an operating frequency range of the SPM head.

Find Patent Forward Citations

Meyer, Charles. (2019). Sample vessel retention structure for scanning probe microscope (U.S. Patent No. 10175263). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10175263

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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