The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 2016
Filed:
May. 27, 2014
Applicant:
Bruker Nano, Inc., Santa Barbara, CA (US);
Inventors:
Assignee:
Bruker Nano, Inc., Santa Barbara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 20/00 (2010.01); B82Y 35/00 (2011.01); G01Q 10/06 (2010.01); G01Q 60/32 (2010.01); G01Q 20/02 (2010.01); G01Q 60/30 (2010.01); G01Q 60/34 (2010.01);
U.S. Cl.
CPC ...
G01Q 20/00 (2013.01); B82Y 35/00 (2013.01); G01Q 10/065 (2013.01); G01Q 20/02 (2013.01); G01Q 60/30 (2013.01); G01Q 60/32 (2013.01); G01Q 60/34 (2013.01);
Abstract
An improved mode of AFM imaging (Peak Force Tapping (PFT) Mode) uses force as the feedback variable to reduce tip-sample interaction forces while maintaining scan speeds achievable by all existing AFM operating modes. Sample imaging and mechanical property mapping are achieved with improved resolution and high sample throughput, with the mode workable across varying environments, including gaseous, fluidic and vacuum.