For the Inventor, By the Inventor

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Santa Barbara, CA, United States of America

Bruke Nano Inc.

USPTO Granted Patents = 2

Forward Citations = 4

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5 inventors (with patents filed for the assignee):

Craig Prater (1 out of 60 patents)

Chanmin Su (1 out of 56 patents)

Jian Shi (1 out of 13 patents)

4. Ji Ma (1 out of 13 patents)

5. Bryan W Guenther (1 out of 13 patents)

2 patents: Sort by Forward Citations

1. 9303631 - Fixture for flattening sample in optical metrology (2016-04-05),

2. 9244096 - Closed loop controller and method for fast scanning probe microscopy (2016-01-26),

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USPTO Data Jan 1 1976 - Dec 30 2025

2 Patents

#148 in Santa Barbara, CA

#20,556 in California

#92,642 in US

Santa Barbara, CA, United States of America

Bruke Nano Inc.

Forward Citations = 4

5 inventors:

Craig Prater (1 out of 60 patents)

Chanmin Su (1 out of 56 patents)

Jian Shi (1 out of 13 patents)

4. Ji Ma (1 out of 13 patents)

5. Bryan W Guenther (1 out of 13 patents)

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