Bryan W Guenther

Title: The Innovative Contributions of Bryan W. Guenther

Introduction

Bryan W. Guenther is a notable inventor based in Tucson, AZ (US), recognized for his significant contributions to optical metrology. With a total of 13 patents to his name, Guenther has developed innovative methods and technologies that enhance measurement accuracy and efficiency in various applications.

Latest Patents

One of Guenther's latest patents is a method for flattening samples in optical metrology. This invention features a vacuum mechanism designed to flatten bowed panel samples. It includes a support structure with coplanar support elements and a fixture with a movable component actuated by a vacuum source. The movable component can be drawn to a coplanar position with the support elements when vacuum is applied, effectively flattening the sample. Another significant patent is for automated re-focusing of an interferometric reference mirror. This invention utilizes a reference surface to create an empirical plot that correlates a parameter of interest, such as roughness, with the position of the reference mirror. The system allows for automated re-calibration based on quality-control measurements, ensuring precise sample measurements.

Career Highlights

Throughout his career, Guenther has worked with prominent companies in the field, including Bruker Nano GmbH and Veeco Instruments Inc. His experience in these organizations has contributed to his expertise and the development of his patented technologies.

Collaborations

Guenther has collaborated with notable professionals in his field, including David J. Aziz and Erik Novak. These collaborations have likely fostered innovation and the exchange of ideas, further enhancing his contributions to optical metrology.

Conclusion

Bryan W. Guenther's work exemplifies the spirit of innovation in the field of optical metrology. His patents and career achievements reflect a commitment to advancing measurement technologies, making a lasting impact in the industry.