The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 1997

Filed:

Mar. 11, 1996
Applicant:
Inventors:

David J Aziz, Tucson, AZ (US);

Bryan W Guenther, Tucson, AZ (US);

Assignee:

Wyko Corporation, Tucson, AZ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ; G02B / ; G01B / ;
U.S. Cl.
CPC ...
359368 ; 359370 ; 359372 ; 359234 ; 359236 ; 359369 ; 359583 ; 356345 ; 356346 ; 356360 ; 25055922 ; 2502013 ;
Abstract

A broad-bandwidth interferometric device is adapted for longitudinal insertion into a cylinder cavity to produce irradiance signals at multiple vertical-scanning positions as a function of optical path differences between a reference mirror incorporated in the probe and the cylinder-wall surface. The light-source beam is passed through an objective lens placed longitudinally in the cylinder and then divided by a beam splitter disposed in fixed relation to the cylinder wall to produce a test beam directed radially to the wall and a reference beam directed axially to a reference mirror disposed in fixed relation to the lens. During scanning, the objective lens and reference mirror are translated together, while the beam splitter remains stationary with respect to the cylinder wall, thereby varying the position of the focal point of the test beam and providing the vertical-scanning effect required to produce interference fringes and a corresponding map of the tested cylinder surface. In order to reduce the length of the instrument, the reference beam may be folded to the side by a reflective surface and the reference mirror may be positioned perpendicularly to the main axis of the instrument. In that case, the lens, fold mirror and reference mirror are all translated together, while the beam splitter remains stationary and fixed with the test surface.


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