The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 20, 2025

Filed:

Nov. 02, 2022
Applicant:

Bruker Nano, Inc., Santa Barbara, CA (US);

Inventors:

Mazen Zawaideh, Carlsbad, CA (US);

Chris Claypool, Carlsbad, CA (US);

Emad Zawaideh, Carlsbad, CA (US);

Assignee:

BRUKER NANO, INC., Goleta, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/21 (2006.01); G01N 21/95 (2006.01); G01N 33/483 (2006.01);
U.S. Cl.
CPC ...
G01N 21/21 (2013.01); G01N 21/9501 (2013.01); G01N 33/4833 (2013.01);
Abstract

An imaging spectropolarimeter configured to examine targets with polarized light, in which orientation of light-polarizing components is judiciously chosen to be target-specific and which employ a three-camera optical detection system defining an optical detection axis with respect to which individual camera analyzers are oriented in a specifically-defined fashion. Programmable electronic circuitry is adapted to substantially simultaneously acquire polarimetric images of the target utilizing intensity information collected by the multi-pixel sensors of the optical detection system.


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