The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2024

Filed:

Nov. 13, 2018
Applicant:

Bruker Nano, Inc., Santa Barbara, CA (US);

Inventors:

Syed Amanulla Syed Asif, Bloomington, MN (US);

Edward Cyrankowski, Woodbury, MN (US);

Bartosz Nowakowski, Plymouth, MN (US);

Douglas D. Stauffer, Minneapolis, MN (US);

Assignee:

Bruker Nano, Inc., Santa Barbara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/06 (2006.01);
U.S. Cl.
CPC ...
G01N 3/062 (2013.01); G01N 3/068 (2013.01); G01N 2203/0226 (2013.01); G01N 2291/02845 (2013.01); G01N 2291/02872 (2013.01);
Abstract

Among other things, a heating jacket configured for heating a mechanical testing instrument having a probe is disclosed herein. The heating jacket includes a heating element including a jacket wall, and the jacket wall extends around a probe recess, the jacket wall is configured to receive a probe of a mechanical testing instrument within the probe recess, and the heating element is mechanically isolated from the probe with a probe gap. Additionally, a system to correct for thermomechanical drift in a mechanical testing assembly is disclosed herein. The system isolates the mechanical testing instrument from thermomechanical drift of a system frame using a determined difference between, for instance, a probe displacement and a sample displacement.


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