The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2024
Filed:
Dec. 15, 2021
Bruker Nano Gmbh, Berlin, DE;
Thomas Schwager, Berlin, DE;
BRUKER NANO GMBH, Berlin, DE;
Abstract
The present invention refers to a method of processing an energy-dispersive X-ray (EDX)/X-ray fluorescence (XRF) map (), comprising selecting a data point (dp) among a plurality of data points of the EDX/XRF map (), wherein each of the data points comprise a local measured value (m) and a local dispersion value (v) of a measured variable; determine a first modified mean value (M[]) based on the local measured value (m) of the selected data point (dp) and the local measured value of at least one neighboring data point neighboring the selected data point (dp) and determine a first modified dispersion value (V[]) based on the local dispersion value (v) of the selected data point (dp) and the dispersion value of the at least one neighboring data point, when m<th, and replace the local measured value (m) of the selected data point (dp) by the first modified mean value (M[]), when M[]>TH[