Berlin, Germany

Thomas Schwager

USPTO Granted Patents = 5 

 

Average Co-Inventor Count = 1.3

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2016-2024

Loading Chart...
Loading Chart...
5 patents (USPTO):Explore Patents

Title: Thomas Schwager: Innovator in EDX/XRF and EBSD/TKD Technologies

Introduction

Thomas Schwager is a prominent inventor based in Berlin, Germany. He has made significant contributions to the fields of energy-dispersive X-ray (EDX) and X-ray fluorescence (XRF) mapping, as well as electron backscatter diffraction (EBSD) and transmission Kikuchi diffraction (TKD) technologies. With a total of 5 patents to his name, Schwager continues to push the boundaries of innovation in his field.

Latest Patents

Among his latest patents, Schwager has developed a method of processing an EDX/XRF map and a corresponding image processing device. This invention involves selecting a data point from an EDX/XRF map, determining modified mean and dispersion values based on neighboring data points, and replacing local measured values to enhance data accuracy. Another notable patent is a method for improving the quality and integrity of an EBSD/TKD map. This method assigns crystal information to defective data points by comparing Kikuchi patterns with simulated patterns from neighboring data points, thereby enhancing the overall quality of the map.

Career Highlights

Thomas Schwager is currently employed at Bruker Nano GmbH, where he applies his expertise in advanced imaging and analysis technologies. His work has been instrumental in developing innovative solutions that improve the accuracy and reliability of material characterization techniques.

Collaborations

Schwager collaborates with Daniel Radu Goran, a fellow expert in the field. Together, they work on advancing the technologies related to EDX/XRF and EBSD/TKD, contributing to the ongoing development of innovative solutions in material science.

Conclusion

Thomas Schwager's contributions to the fields of EDX/XRF and EBSD/TKD technologies highlight his role as a leading inventor. His innovative methods and collaborative efforts continue to shape the future of material characterization.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…