The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2025
Filed:
Feb. 02, 2024
Applicant:
Bruker Nano, Inc., Goleta, CA (US);
Inventors:
Sergey Osechinskiy, Goleta, CA (US);
Anthonius Ruiter, Goleta, CA (US);
Bede Pittenger, Goleta, CA (US);
Syed-Asif Syed-Amanulla, Minneapolis, MN (US);
Assignee:
BRUKER NANO, INC., Goleta, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 60/38 (2010.01); G01Q 10/04 (2010.01); G01Q 20/04 (2010.01); G01Q 30/04 (2010.01); B82Y 35/00 (2011.01);
U.S. Cl.
CPC ...
G01Q 60/38 (2013.01); G01Q 10/04 (2013.01); G01Q 20/04 (2013.01); G01Q 30/04 (2013.01); B82Y 35/00 (2013.01);
Abstract
An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.