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Pleasanton, CA, United States of America

Carl Zeiss X-Ray Microscopy, Inc.

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USPTO Granted Patents = 42

EPO Patents = 11

Trademarks = 3

Forward Citations = 258

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39 inventors (with patents filed for the assignee):

Thomas Anthony Case (12 out of 19 patents)

Matthew Andrew (9 out of 10 patents)

Wenbing Yun (6 out of 94 patents)

4. Michael Feser (6 out of 17 patents)

5. Srivatsan Seshadri (5 out of 16 patents)

6. Claus Flachenecker (5 out of 10 patents)

7. Christoph Hilmar Graf Vom Hagen (5 out of 6 patents)

8. William Dean Thompson (4 out of 6 patents)

9. Zhifeng Huang (4 out of 4 patents)

10. Erik Mejdal Lauridsen (4 out of 9 patents)

11. Johannes Ruoff (3 out of 40 patents)

12. Susan Candell (3 out of 7 patents)

13. Christian Holzner (3 out of 5 patents)

14. David Lewis Adler (3 out of 75 patents)

15. Thomas Matthew Gregorich (3 out of 3 patents)

Core Competencies:

3D Particle Analysis

X-Ray Calibration

Super-Resolution

Crystallographic Analysis

Image Reconstruction

X-Ray Diffraction

Neural Network Processing

Microscopy Systems

Optical Arrangement

Multimodality Segmentation

X-Ray Inspection

Fiber-Optic Communication

42 patents: Sort by Forward Citations

1. 12736485 - Multi-fraction sample holder for 3D particle analysis (2026-09-15),

2. 12718320 - X-ray super-resolution assessment via spatial filtering (2026-08-25),

3. 12625090 - Imaging optical arrangement to image an object illuminated by X-rays (2026-05-12),

4. 12602756 - Method and system for analytical x-ray calibration, reconstruction and indexing using simulation (2026-04-14),

5. 12590912 - Laboratory crystallographic x-ray diffraction analysis system (2026-03-31),

6. 12487194 - 3D particle analysis and separation using dual seeding (2025-12-02),

7. 12419591 - Spectrally and spatially resolved x-ray and particle detection system (2025-09-23),

8. 12213238 - Reflection target X-ray source with steered beam on target (2025-01-28),

9. 12148138 - Process parameter prediction using multivariant structural regression (2024-11-19),

10. 12130392 - High resolution light valve detector for detecting x-ray (2024-10-29),

11. 12035451 - Method and system for liquid cooling isolated x-ray transmission target (2024-07-09),

12. 11972511 - Accessible neural network image processing workflow (2024-04-30),

13. 11961694 - Fiber-optic communication for embedded electronics in x-ray generator (2024-04-16),

14. 11935228 - Method to acquire a 3D image of a sample structure (2024-03-19),

15. 11864300 - X-ray source with liquid cooled source coils (2024-01-02),

Company Overview

Carl Zeiss X-Ray Microscopy, Inc. specializes in advanced imaging solutions, focusing on x-ray microscopy technologies that enable high-resolution, three-dimensional imaging of materials and biological specimens. The company is known for its innovative contributions to the fields of materials science, life sciences, and industrial applications. Based in Pleasanton, CA, it serves a global market, providing researchers and industries with tools that enhance their understanding of complex structures at the micro and nano scales.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

42 Patents

#20 in Pleasanton, CA

#1,943 in California

#8,266 in US

#16,374 in the World

Pleasanton, CA, United States of America

Carl Zeiss X-Ray Microscopy, Inc.

Forward Citations = 258

39 inventors:

Thomas Anthony Case (12 out of 19 patents)

Matthew Andrew (9 out of 10 patents)

Wenbing Yun (6 out of 94 patents)

4. Michael Feser (6 out of 17 patents)

5. Srivatsan Seshadri (5 out of 16 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Carl Zeiss X-Ray Microscopy, Inc.. Retrieved from https://idiyas.com/company/carl-zeiss-x-ray-microscopy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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