The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2026
Filed:
Jun. 16, 2022
Carl Zeiss X-ray Microscopy, Inc., Dublin, CA (US);
Xnovo Technology Aps, Koege, DK;
Christian Holzner, Wettringen, DE;
Erik Mejdal Lauridsen, Haarlev, DK;
Peter Reischig, Leicester, GB;
Carl Zeiss X-ray Microscopy, Inc., Dublin, CA (US);
Xnovo Technology ApS, Koege, DK;
Abstract
A method and system for three dimensional crystallographic grain orientation mapping for objects. In different examples, subbeams are used that interact with the object at different angles. Other options include rocking the object at different angles during a raster scan. Multiple scans can be performed including raster scanning and directed analysis. In addition, different apertures can be employed. In examples, a dispersive spectroscopy (EDS) detector is added to analysis the energy of the diffracted photons.