The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2024
Filed:
Sep. 26, 2020
Applicant:
Carl Zeiss X-ray Microscopy, Inc., Pleasanton, CA (US);
Inventor:
Matthew Andrew, Pleasanton, CA (US);
Assignee:
Carl Zeiss X-ray Microscopy, Inc., Pleasanton, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16C 20/30 (2019.01); G06F 17/18 (2006.01); G06N 3/02 (2006.01); G06N 20/00 (2019.01); G06T 7/00 (2017.01); G16C 20/70 (2019.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06F 17/18 (2013.01); G06N 3/02 (2013.01); G06N 20/00 (2019.01);
Abstract
Multivariant feature extraction is used for training volumes or 2D images, (real or synthetic) coupled to process (effective) values probably obtained from direct simulation. These features are coupled with machine learning/regression algorithms to make a predictive model for the effective property. This model can then be used on a real geometry of a sample for effective parameter prediction.