The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2024
Filed:
Nov. 05, 2019
Applicant:
Carl Zeiss X-ray Microscopy, Inc., Dublin, CA (US);
Inventors:
Xiaochao Xu, Pleasanton, CA (US);
Christoph Graf Vom Hagen, Oakland, CA (US);
Assignee:
Carl Zeiss X-ray Microscopy Inc., Dublin, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/24 (2006.01); G02B 21/00 (2006.01); H01J 37/244 (2006.01);
U.S. Cl.
CPC ...
G01T 1/246 (2013.01); G02B 21/0092 (2013.01); H01J 37/244 (2013.01); H01J 2237/24415 (2013.01);
Abstract
A detection system for an x-ray microscopy system utilizes high bandgap, direct conversion x-ray detection materials. The signal of the x-ray projection is recorded in a spatial light modulator such as a liquid crystal (LC) light valve. The light valve is then read-out by a polarized light optical microscope. This configuration will mitigate the loss of light in the optical system over the current scintillator-optical microscope-camera detection systems.