The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2025
Filed:
Oct. 20, 2022
Applicant:
Carl Zeiss X-ray Microscopy, Inc., Dublin, CA (US);
Inventors:
Evan Drake, Dublin, CA (US);
Matthew Andrew, Livermore, CA (US);
Assignee:
CARL ZEISS X-RAY MICROSCOPY, INC., Dublin, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G01N 23/046 (2018.01); G01N 23/083 (2018.01); G01N 33/24 (2006.01); G06T 7/136 (2017.01); G06T 7/168 (2017.01); G06T 7/194 (2017.01); G06T 7/60 (2017.01); G06V 20/69 (2022.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); G01N 23/083 (2013.01); G01N 33/24 (2013.01); G06T 7/136 (2017.01); G06T 7/168 (2017.01); G06T 7/194 (2017.01); G06T 7/60 (2013.01); G06V 20/698 (2022.01); G01N 2223/04 (2013.01); G01N 2223/3306 (2013.01); G01N 2223/419 (2013.01); G01N 2223/616 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/20092 (2013.01); G06T 2207/20212 (2013.01); G06T 2207/30204 (2013.01);
Abstract
A multi scale material segmentation method is provided that creates markers to identify unique particles, for small and large particles independently, and then separately processes those markers.