The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2024

Filed:

Jul. 09, 2021
Applicant:

Carl Zeiss X-ray Microscopy Inc., Dublin, CA (US);

Inventors:

Matthew Andrew, Livermore, CA (US);

Lars Omlor, Pleasanton, CA (US);

Andriy Andreyev, Dublin, CA (US);

Christoph Hilmar Graf Vom Hagen, Oakland, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 18/211 (2023.01); G06F 18/21 (2023.01); G06F 18/214 (2023.01); G06N 3/0475 (2023.01); G06N 3/08 (2023.01); G06N 3/0985 (2023.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 11/006 (2013.01); G06F 18/211 (2023.01); G06F 18/214 (2023.01); G06F 18/2163 (2023.01); G06F 18/2178 (2023.01); G06N 3/0475 (2023.01); G06N 3/08 (2013.01); G06N 3/0985 (2023.01); G06T 2211/432 (2013.01); G06T 2211/441 (2023.08);
Abstract

Improved (e.g., high-throughput, low-noise, and/or low-artifact) X-ray Microscopy images are achieved using a deep neural network trained via an accessible workflow. The workflow involves selection of a desired improvement factor (x), which is used to automatically partition supplied data into two or more subsets for neural network training. The neural network is trained by generating reconstructed volumes for each of the subsets. The neural network can be trained to take projection images or reconstructed volumes as input and output improved projection images or improved reconstructed volumes as output, respectively. Once trained, the neural network can be applied to the training data and/or subsequent data—optionally collected at a higher throughput—to ultimately achieve improved de-noising and/or other artifact reduction in the reconstructed volume.


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