The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 23, 2025
Filed:
Apr. 24, 2020
Carl Zeiss X-ray Microscopy, Inc., Dublin, CA (US);
Xiaochao Xu, Pleasanton, CA (US);
Christoph Graf Vom Hagen, Schwaebisch Gmuend, DE;
CARL ZEISS X-RAY MICROSCOPY, INC., Dublin, CA (US);
Abstract
A detection system for an x-ray or charged particle imaging system utilizes high bandgap, direct conversion x-ray detection materials. The signal of the x-ray/charged particle projection is recorded in a spatial light modulator such as a liquid crystal (LC) light valve. The light valve is then read-out by a polarized light optical microscope and a high speed camera. The camera is used to track the blooming spots in the light valve to resolve their intensity, and relate that intensity of the input x-ray photon or charged particle. This allows of spatially resolved, imaging, x-ray and/or charged particle spectrometer.