The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2022
Filed:
Feb. 10, 2020
Applicant:
Bruker Nano, Inc., Santa Barbara, CA (US);
Inventor:
David Lewis Adler, San Jose, CA (US);
Assignee:
Bruker Nano, Inc., Santa Barbara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21K 7/00 (2006.01); G01N 23/083 (2018.01); G01N 23/04 (2018.01); H01L 21/66 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G21K 7/00 (2013.01); G01N 23/04 (2013.01); G01N 23/083 (2013.01); G06T 7/0002 (2013.01); H01L 22/12 (2013.01); G21K 2207/005 (2013.01);
Abstract
In one embodiment, an automated high-speed X-ray inspection tool may emit, by an X-ray source, an X-ray beam to an object of interest with a portion of the X-ray beam penetrating through the object of interest. The automated high-speed X-ray inspection tool may capture, by an X-ray sensor, one or more X-ray images of the object of interest based on the portion of the X-ray beam that penetrates through the object of interest. Each of the X-ray images may be captured with a field of view of at least 12 million pixels.