The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2020

Filed:

Aug. 02, 2018
Applicant:

Svxr, Inc., San Jose, CA (US);

Inventors:

Edward R. Ratner, Madison, SD (US);

David L. Adler, San Jose, CA (US);

Assignee:

SVXR, INC., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2018.01); G06T 3/40 (2006.01); G01N 23/18 (2018.01); G06T 5/50 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06T 3/4053 (2013.01); G01N 23/04 (2013.01); G01N 23/18 (2013.01); G06T 5/50 (2013.01); G06K 9/6257 (2013.01); G06K 9/6269 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/20221 (2013.01);
Abstract

The presently-disclosed technology improves the resolution of an x-ray microscope so as to obtain super-resolution x-ray images having resolutions beyond the maximum normal resolution of the x-ray microscope. Furthermore, the disclosed technology provides for the rapid generation of the super-resolution x-ray images and so enables real-time super-resolution x-ray imaging for purposes of defect detection, for example. A method of super-resolution x-ray imaging using a super-resolving patch classifier is provided. In addition, a method of training the super-resolving patch classifier is disclosed. Other embodiments, aspects and features are also disclosed.


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