Edward R Ratner

Title: The Innovations of Edward R Ratner

Introduction

Edward R Ratner is a notable inventor based in Minneapolis, MN (US). He has made significant contributions to the field of manufacturing and inspection technologies, holding a total of four patents. His work primarily focuses on methods for inspecting and classifying defects in subcomponents of manufactured components.

Latest Patents

One of his latest patents is titled "Method and apparatus for rapid inspection of subcomponents of manufactured component." This technology enables real-time inspection of multiple subcomponents in parallel, such as through-silicon vias in semiconductor packages. The method involves extracting images of subcomponents, computing transformed feature vectors, and determining proximity metrics to detect defects. Another significant patent is "Method and apparatus for rapidly classifying defects in subcomponents of manufactured component." This innovation allows for real-time classification of detected defects, enhancing the efficiency of the defect detection process.

Career Highlights

Edward has worked with several prominent companies, including Svxr, Inc. and Bruker Nano GmbH. His experience in these organizations has contributed to his expertise in the field of manufacturing technologies.

Collaborations

Some of his notable coworkers include David Lewis Adler and Andrew George Reid. Their collaboration has likely fostered innovative ideas and advancements in their respective fields.

Conclusion

Edward R Ratner's contributions to the field of manufacturing and inspection technologies are noteworthy. His patents reflect a commitment to improving the efficiency and accuracy of defect detection in complex components.