Los Gatos, CA, United States of America

Mehdi Vaez-Iravani

This inventor holds 108 USPTO granted patents and 13 published patent applications and 4 EPO patents, primarily in Semiconductor Packaging (CPC class G01N21-9501). Top assignees: Kla Tencor Corporation, Applied Materials, Inc., Kla-Tencor Technologies Corporation. Active years: 1998-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mehdi Vaez-Iravani. Retrieved from https://idiyas.com/inventor/mehdi-vaez-iravani

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 108 

% Patents Active = 83.3

 

Average Co-Inventor Count = 3.0

ph-index = 21

Forward Citations = 1,827(Granted Patents)

Forward Citations (Not Self Cited) = 1,598(Dec 10, 2025)


Inventors with similar research interests:

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Location History:

  • Santa Clara, CA (US) (1998 - 2007)
  • Los Gatos, CA (US) (2003 - 2024)

Company Filing History:


Years Active: 1998-2026

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Areas of Expertise:
Hybrid Bonding
Overlay Metrology
Spatial Genomics Imaging
Subsurface Alignment
Surface Deformations
Thickness Variations
Particulate Detection
Digital Lithography
In-Situ Metrology
Wafer Inspection
Reflectometry
Optical Microscopy
108 patents (USPTO):Explore Patents

Title: Mehdi Vaez-Iravani: Driving Innovation in Technology Companies

Introduction:

Throughout his distinguished career, Mehdi Vaez-Iravani has been a prominent figure in the technology industry, playing a vital role in driving innovation. Based in Los Gatos, CA (US), Vaez-Iravani's contributions to the field of technology have been significant, evidenced by his extensive patent portfolio and numerous achievements. In this article, we will explore his latest patents, career highlights, notable collaborations, and the impact he has made on the industry.

Latest Patents:

Mehdi Vaez-Iravani's most recent patents exemplify his expertise in developing advanced technologies for particle detection and measurement in fluids. One of his latest inventions is the "In-situ, real-time detection of particulate defects in a fluid." This patent introduces an apparatus and method for detecting particles in a fluid, leveraging an imaging device with a lens and detector, combined with a laser source for enhanced accuracy.

Additionally, Vaez-Iravani holds a patent for the "Method and apparatus for detection of particle size in a fluid." This patent focuses on systems and methods for detecting the size of particles in a fluid. By utilizing multiple laser beams and a digital detector, his invention allows for precise imaging and analysis of scattered light from particles, enabling accurate particle size determination.

Career Highlights:

With an impressive 94 patents under his name, Mehdi Vaez-Iravani has established himself as a trailblazer in the technology industry. His expertise and contributions have been honed through his involvement with leading companies, including KLA-Tencor Corporation and KLA-Tencor Technologies Corporation.

Collaborations:

During his fruitful career, Vaez-Iravani has had the privilege of collaborating with some esteemed professionals in the field. Notably, he has worked alongside Guoheng Zhao and Stanley E Stokowski. Through these collaborations, Vaez-Iravani has been able to combine his innovative thinking with the expertise of his peers, further propelling advancements in technology.

Conclusion:

Mehdi Vaez-Iravani's impact on the technology industry cannot be understated. His innovative thinking, coupled with his leadership positions in renowned companies, has brought forth groundbreaking inventions and advancements in particle detection and measurement. With an impressive patent portfolio and numerous successful collaborations, Vaez-Iravani continues to drive innovation in the technology sector. As a visionary in the field, he remains an inspiration to aspiring inventors and is undoubtedly a catalyst for further advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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