The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 15, 2026

Filed:

May. 16, 2024
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Mehdi Vaez-Iravani, Los Gatos, CA (US);

Todd J. Egan, Fremont, CA (US);

Kyle Ross Tantiwong, Livermore, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); C23C 14/34 (2006.01); C23C 14/54 (2006.01); C23C 16/44 (2006.01); C23C 16/52 (2006.01); G01N 21/01 (2006.01); H01J 37/34 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32972 (2013.01); C23C 14/34 (2013.01); C23C 14/54 (2013.01); C23C 16/4401 (2013.01); C23C 16/52 (2013.01); G01N 21/01 (2013.01); H01J 37/32477 (2013.01); H01J 37/3476 (2013.01); H01J 2237/3321 (2013.01);
Abstract

Implementations disclosed describe a system that includes a deposition chamber, a light source to produce an incident beam of light, wherein the incident beam of light is to illuminate a region of the deposition chamber, and a camera to collect a scattered light originating from the illuminated region of the deposition chamber, wherein the scattered light is to be produced upon interaction of the first incident beam of light with particles inside the illuminated region of the deposition chamber. The described system may optionally have a processing device, coupled to the camera, to generate scattering data for a plurality of locations of the illuminated region, wherein the scattering data for each location comprises intensity of the scattered light originating from this location.


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