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Fremont, CA, United States of America

Todd J Egan

USPTO Granted Patents = 69 

Average Co-Inventor Count = 5.2

ph-index = 7

Forward Citations = 186(Granted Patents)

Forward Citations (Not Self Cited) = 157(Oct 12, 2025)


Inventors with similar research interests:


Company Filing History:

goldMedal68 out of 13,684 
 
Applied Materials, Inc.
 patents
silverMedal1 out of 533 
 
Applied Materials Israel Limited
 patents

Years Active: 2011-2025

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69 patents (USPTO):
1. 12276490 - System and method to map thickness variations of substrates in manufacturing systems (2025-04-14),
2. 12265377 - Autonomous substrate processing system (2025-04-01),
3. 12225808 - In-line monitoring of OLED layer thickness and dopant concentration (2025-02-11),
4. 12211717 - Spatial pattern loading measurement with imaging metrology (2025-01-28),
5. 12098914 - Surface roughness and emissivity determination (2024-09-24),
6. 12062583 - Optical metrology models for in-line film thickness measurements (2024-08-13),
7. 12002665 - Real-time detection of particulate matter during deposition chamber manufacturing (2024-06-04),
8. 11927535 - Metrology for OLED manufacturing using photoluminescence spectroscopy (2024-03-12),
9. 11908716 - Image-based in-situ process monitoring (2024-02-20),
10. 11901203 - Substrate process endpoint detection using machine learning (2024-02-13),
11. 11898249 - PECVD process (2024-02-13),
12. 11856833 - In-line monitoring of OLED layer thickness and dopant concentration (2023-12-26),
13. 11709477 - Autonomous substrate processing system (2023-07-25),
14. 11662317 - Metrology for OLED manufacturing using photoluminescence spectroscopy (2023-05-30),
15. 11613812 - PECVD process (2023-03-28),

As an AI assistant of idiyas.com, focusing on innovations, inventions, inventors, patent attorneys, assignees, and patents, I am delighted to provide you with an article about the accomplished inventor Todd J Egan from Fremont, CA (US), who has an impressive 58 patents to his name.

Title: Unveiling the Inventive Mind of Todd J Egan

Introduction: Todd J Egan is a distinguished inventor based in Fremont, CA (US) whose innovative spirit has led to the creation of 58 patents across various technological domains.

Latest Patents:

1. *In-line monitoring of OLED layer thickness and dopant concentration*: Todd's groundbreaking work involves enhancing the efficiency of organic light-emitting diode (OLED) deposition systems through precise layer stack formation and monitoring. This patent highlights his expertise in optimizing OLED manufacturing processes.

2. *Autonomous substrate processing system*: Todd's inventive streak shines through in this patent, showcasing his role in developing a cutting-edge substrate processing system that harnesses machine learning models for efficient maintenance and rejuvenation of process chambers.

Career Highlights: Todd J Egan is an integral part of Applied Materials, Inc., where his innovative contributions have significantly influenced the field of materials engineering and semiconductor manufacturing. His relentless pursuit of excellence is evident in the multitude of patents he has successfully secured.

Collaborations: Todd has had the privilege of working alongside accomplished professionals such as Edward W Budiarto and Wei-Sheng Lei, whose collaborative efforts have further enriched the innovative landscape at Applied Materials, Inc.

Conclusion: In conclusion, Todd J Egan's remarkable journey as an inventor exemplifies a relentless commitment to pushing the boundaries of technological advancement. His pioneering work in OLED deposition systems and autonomous substrate processing stands as a testament to his indomitable spirit of innovation.

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