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For the Inventor, By the Inventor

Rehovot, Israel

Applied Materials Israel Limited


USPTO Granted Patents = 536


Forward Citations = 2,158

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534 inventors (with patents filed for the assignee):

goldMedal Haim Feldman (34 out of 45 patents)

silverMedal Boaz Cohen (27 out of 30 patents)

bronzeMedal Alon Litman (27 out of 30 patents)

4.  Ron Naftali (25 out of 46 patents)

5.  Dror Shemesh (25 out of 30 patents)

6.  Idan Kaizerman (24 out of 26 patents)

7.  Ishai Schwarzband (24 out of 24 patents)

8.  Yoram Uziel (21 out of 44 patents)

9.  Roman Kris (19 out of 19 patents)

10.  Yehuda Zur (18 out of 19 patents)

11.  Efrat Rozenman (18 out of 18 patents)

12.  Pavel Margulis (17 out of 17 patents)

13.  Rainer K Knippelmeyer (17 out of 30 patents)

14.  Amit Batikoff (16 out of 16 patents)

15.  Igor Krivts (Krayvitz) (15 out of 15 patents)


Core Competencies:
Semiconductor Specimens
Machine Learning
Optical Inspection
Defect Detection
Metrology
X-ray Measurements
Electron Beam
Stereoscopic Measurements
Image Processing
Wafer Thickness
Tomography
Overlay Target

536 patents:

1. 12511720 - Image denoising for examination of a semiconductor specimen (2025-12-30),
2. 12498333 - Defect offset correction for examination of semiconductor specimens (2025-12-16),
3. 12493944 - Optimization of the recipe of an examination tool (2025-12-09),
4. 12489020 - End-to-end measurement for semiconductor specimens (2025-12-02),
5. 12487273 - Optimal determination of an overlay target (2025-12-02),
6. 12480898 - Z-profiling of wafers based on X-ray measurements (2025-11-25),
7. 12480889 - Inspection recipe optimization for semiconductor specimens (2025-11-25),
8. 12480614 - Support unit (2025-11-25),
9. 12469124 - Machine learning based yield prediction (2025-11-11),
10. 12456600 - Scanning electron microscopy-based tomography of specimens (2025-10-28),
11. 12455254 - Electrical impedance measurement using an electron beam (2025-10-28),
12. 12455187 - Sample related system that includes a load lock (2025-10-28),
13. 12451323 - Flow for high resolution stereoscopic measurements (2025-10-21),
14. 12436401 - Polarization optical system (2025-10-07),
15. 12423800 - Machine learning based defect examination for semiconductor specimens (2025-09-23),
Applied Materials Israel Limited is a subsidiary of Applied Materials, Inc., a global leader in materials engineering solutions for the semiconductor, display, and related industries. Applied Materials Israel focuses on developing and delivering innovative materials and processes to enable advanced manufacturing technologies. With a strong commitment to research and development, the company plays a crucial role in driving technological advancements in Israel's high-tech industry.
This text is generated by artificial intelligence and may not be accurate.

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USPTO Data Jan 1 1976 - Dec 30 2025

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536 Patents

#2 in Rehovot

#9 in Israel

#1,766 in the World

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Rehovot, Israel

Applied Materials Israel Limited

Forward Citations = 2,158

534 inventors:

goldMedal Haim Feldman (34 out of 45 patents)

silverMedal Boaz Cohen (27 out of 30 patents)

bronzeMedal Alon Litman (27 out of 30 patents)

4.  Ron Naftali (25 out of 46 patents)

5.  Dror Shemesh (25 out of 30 patents)

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