Shoham, Israel

Ron Naftali

USPTO Granted Patents = 46 

Average Co-Inventor Count = 3.4

ph-index = 10

Forward Citations = 306(Granted Patents)


Location History:

  • Kiriat Ono, IL (2000 - 2002)
  • Shoam, IL (2003 - 2005)
  • Shoharn, IL (2006)
  • Shoham, IL (US) (2008)
  • Delft, NL (2019)
  • Shoham, IL (2004 - 2023)

Company Filing History:


Years Active: 2000-2025

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46 patents (USPTO):Explore Patents

Title: Innovations and Contributions of Ron Naftali in the Field of Patents

Introduction

Ron Naftali, an esteemed inventor based in Shoham, IL, has made significant contributions to technology, holding an impressive portfolio of 44 patents. His innovations primarily focus on advanced methods in semiconductor manufacturing and evaluation technologies, demonstrating a commitment to enhancing efficiency and precision in the industry.

Latest Patents

Among his notable patents, one is titled "Die-to-Multi-Die Wafer Inspection." This patent reveals a computer-based method designed to obtain and analyze multi-die scan data of patterned wafers. The method sequentially scans multiple sets of slices on a wafer and performs die-to-multi-die (D2MD) analysis on each slice segment to identify defects. This innovative approach allows for a detailed comparison of scan data across different die-columns, facilitating high-accuracy inspections.

Another significant patent is "Method and System for Evaluating Objects." This invention encompasses a system that includes evaluation units, an object distribution mechanism, and controllers. Each evaluation unit is designed to house objects within a chamber optimized for precision measurements, using charged particle beams to evaluate and detect emitted particles. This method enhances the assessment of various objects, thus contributing to advancements in evaluation technology.

Career Highlights

Ron Naftali's career includes impactful experiences with renowned companies such as Applied Materials Israel Limited and Applied Materials, Inc. His tenure in these organizations has allowed him to develop significant technological advancements, and his work has had far-reaching effects on the semiconductor industry.

Collaborations

Throughout his career, Naftali has collaborated with notable peers including Haim Feldman and Boris Goldberg. Their joint efforts have likely fostered a rich environment for innovation and creative problem-solving, further enhancing the scope of their collective contributions to the field.

Conclusion

Ron Naftali's innovative spirit and technical expertise have yielded numerous patents that advance the capabilities of semiconductor inspection and evaluation technologies. His work exemplifies the vital role inventors play in the evolution of technology, driving progress and delivering valuable solutions to complex industry challenges. Naftali's contributions will undoubtedly continue to influence the field for years to come.

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