Roman Kris

This inventor holds 20 USPTO granted patents and 1 published patent application, primarily in Semiconductor Metrology. Top assignee: Applied Materials Israel Limited. Active years: 2010-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Roman Kris. Retrieved from https://idiyas.com/inventor/roman-kris

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

USPTO Granted Patents = 20 (Patent Applications = 1)

% Patents Active = 95.0

Average Co-Inventor Count = 6.6

ph-index = 2

Forward Citations = 23(Granted Patents)

Company Filing History:

20 out of 574

Applied Materials Israel Limited

patents

Years Active: 2010-2026

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Areas of Expertise:

Semiconductor

Metrology

3D-NAND

CDSEM

Wafer Inspection

Epitaxy

Critical Dimension

Overlay Measurement

Nanometric Structures

Image Registration

Fin Field Effect Transistors

Height Measurement

20 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 12711605 - SYSTEMS AND METHODS FOR REGISTRATION BETWEEN IMAGES INFORMATIVE OF ONE OR MORE SEMICONDUCTOR SPECIMENS (2026-08-18),

2. 12347734 - Examination of a hole formed in a semiconductor specimen (2025-07-01),

3. 11756188 - Determining a critical dimension variation of a pattern (2023-09-12),

4. 11686571 - Local shape deviation in a semiconductor specimen (2023-06-27),

5. 11651509 - Method, system and computer program product for 3D-NAND CDSEM metrology (2023-05-16),

6. 11476081 - Evaluating an intermediate product related to a three-dimensional NAND memory unit (2022-10-18),

7. 11455715 - Epitaxy metrology in fin field effect transistors (2022-09-27),

8. 11443420 - Generating a metrology recipe usable for examination of a semiconductor specimen (2022-09-13),

9. 11301983 - Measuring height difference in patterns on semiconductor wafers (2022-04-12),

10. 11276160 - Determining a critical dimension variation of a pattern (2022-03-15),

11. 11056404 - Evaluating a hole formed in an intermediate product (2021-07-06),

12. 10748272 - Measuring height difference in patterns on semiconductor wafers (2020-08-18),

13. 10731979 - Method for monitoring nanometric structures (2020-08-04),

14. 10354376 - Technique for measuring overlay between layers of a multilayer structure (2019-07-16),

15. 9916652 - Technique for measuring overlay between layers of a multilayer structure (2018-03-13),

Title: The Innovative Mind of Roman Kris: A Journey Through His Patents and Career

Introduction: Roman Kris, an accomplished inventor based in Jerusalem, Israel, has made significant contributions to the field of semiconductor technology. With a total of 18 patents to his name, Kris continues to push the boundaries of innovation, developing solutions that address critical challenges in the industry.

Latest Patents: Among his latest notable patents, Roman Kris has introduced groundbreaking methodologies for evaluating semiconductor patterns. One of his recent inventions focuses on "Determining a critical dimension variation of a pattern." This patent allows for the input of data, including images of patterns, to identify modifications and classify defects based on combined dimensional parameters. Another innovative patent titled "Local shape deviation in a semiconductor specimen" describes a system for detecting deviations in structural elements of a semiconductor. This method includes extracting image contours, estimating reference contours using Fourier descriptors, and measuring differences to determine local shape deviations.

Career Highlights: Roman Kris is currently employed at Applied Materials Israel Limited, where he contributes to advanced semiconductor technology. His expertise and inventive spirit have allowed him to develop several patents that enhance the efficiency and accuracy of semiconductor manufacturing processes.

Collaborations: Throughout his career, Roman has worked alongside talented individuals such as Ishai Schwarzband and Shimon Levi. Their collaboration demonstrates a commitment to innovation and advancing technology within the semiconductor field.

Conclusion: Roman Kris is a distinguished inventor whose work has significantly impacted semiconductor technology. With a portfolio of 18 patents and a dedication to improving processes, he continues to inspire future generations of innovators in Jerusalem and beyond. His achievements underscore the importance of creativity and collaboration in driving technological advancements.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent pending: