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For the Inventor, By the Inventor

Jerusalem, Israel

Roman Kris

USPTO Granted Patents = 19 

Average Co-Inventor Count = 6.6

ph-index = 2

Forward Citations = 21(Granted Patents)


Company Filing History:

goldMedal19 out of 535 
 
Applied Materials Israel Limited
 patents

Years Active: 2010-2025

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19 patents (USPTO):Explore Patents
1. 12347734 - Examination of a hole formed in a semiconductor specimen (2025-07-01),
2. 11756188 - Determining a critical dimension variation of a pattern (2023-09-12),
3. 11686571 - Local shape deviation in a semiconductor specimen (2023-06-27),
4. 11651509 - Method, system and computer program product for 3D-NAND CDSEM metrology (2023-05-16),
5. 11476081 - Evaluating an intermediate product related to a three-dimensional NAND memory unit (2022-10-18),
6. 11455715 - Epitaxy metrology in fin field effect transistors (2022-09-27),
7. 11443420 - Generating a metrology recipe usable for examination of a semiconductor specimen (2022-09-13),
8. 11301983 - Measuring height difference in patterns on semiconductor wafers (2022-04-12),
9. 11276160 - Determining a critical dimension variation of a pattern (2022-03-15),
10. 11056404 - Evaluating a hole formed in an intermediate product (2021-07-06),
11. 10748272 - Measuring height difference in patterns on semiconductor wafers (2020-08-18),
12. 10731979 - Method for monitoring nanometric structures (2020-08-04),
13. 10354376 - Technique for measuring overlay between layers of a multilayer structure (2019-07-16),
14. 9916652 - Technique for measuring overlay between layers of a multilayer structure (2018-03-13),
15. 9824852 - CD-SEM technique for wafers fabrication control (2017-11-21),

Title: The Innovative Mind of Roman Kris: A Journey Through His Patents and Career

Introduction: Roman Kris, an accomplished inventor based in Jerusalem, Israel, has made significant contributions to the field of semiconductor technology. With a total of 18 patents to his name, Kris continues to push the boundaries of innovation, developing solutions that address critical challenges in the industry.

Latest Patents: Among his latest notable patents, Roman Kris has introduced groundbreaking methodologies for evaluating semiconductor patterns. One of his recent inventions focuses on "Determining a critical dimension variation of a pattern." This patent allows for the input of data, including images of patterns, to identify modifications and classify defects based on combined dimensional parameters. Another innovative patent titled "Local shape deviation in a semiconductor specimen" describes a system for detecting deviations in structural elements of a semiconductor. This method includes extracting image contours, estimating reference contours using Fourier descriptors, and measuring differences to determine local shape deviations.

Career Highlights: Roman Kris is currently employed at Applied Materials Israel Limited, where he contributes to advanced semiconductor technology. His expertise and inventive spirit have allowed him to develop several patents that enhance the efficiency and accuracy of semiconductor manufacturing processes.

Collaborations: Throughout his career, Roman has worked alongside talented individuals such as Ishai Schwarzband and Shimon Levi. Their collaboration demonstrates a commitment to innovation and advancing technology within the semiconductor field.

Conclusion: Roman Kris is a distinguished inventor whose work has significantly impacted semiconductor technology. With a portfolio of 18 patents and a dedication to improving processes, he continues to inspire future generations of innovators in Jerusalem and beyond. His achievements underscore the importance of creativity and collaboration in driving technological advancements.

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