The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2022
Filed:
Oct. 01, 2018
Applied Materials Israel Ltd., Rehovot, IL;
Vadim Vereschagin, Hod-HaSharon, IL;
Roman Kris, Jerusalem, IL;
Ishai Schwarzband, Or-Yehuda, IL;
Boaz Cohen, Lehavim, IL;
Ariel Shkalim, Even-Shmuel, IL;
Evgeny Bal, Natanya, IL;
Applied Materials Israel LTD., Rehovot, IL;
Abstract
A captured image of a pattern and a reference image of the pattern may be received. A contour of interest of the pattern may be identified. One or more measurements of a dimension of the pattern may be determined for each of the reference image and the captured image with respect to the contour of interest of the pattern. A defect associated with the contour of interest may be classified based on the determined one or more measurements of the dimension of the pattern for each of the reference image and the captured image.