Location History:
- Yehuda, IL (2013 - 2016)
- Of-Yehuda, IL (2017)
- Or-Yehuda, IL (2007 - 2023)
Company Filing History:
Years Active: 2007-2023
Title: Ishai Schwarzband: Innovating Precision Measurements in Semiconductor Fabrication
Introduction:
In the dynamic world of semiconductor fabrication, certain individuals stand out for their remarkable contributions and relentless pursuit of innovation. Ishai Schwarzband, hailing from Or-Yehuda, Israel, is one such individual. With a prolific portfolio of 24 patents and a key role at Applied Materials Israel Limited, Schwarzband has played a significant role in advancing critical dimension variation determination and 3D-NAND CDSEM metrology. Let's take a closer look at his latest patents, career highlights, and collaborations.
Latest Patents:
Ishai Schwarzband has recently patented two groundbreaking technologies, showcasing his expertise in precision measurements within semiconductor fabrication.
1. Determining a critical dimension variation of a pattern:
This patent involves the determination of critical dimension variations in patterns used in semiconductor fabrication. By receiving input data, such as an image of a pattern and location data, a processing device can identify modified portions within the pattern. Schwarzband's innovative combined set generation, incorporating parameters from both within and outside of the pattern, enables the classification of defects associated with modified portions.
2. Method, system, and computer program product for 3D-NAND CDSEM metrology:
This patent addresses the process control of semiconductor structures fabricated through multiple steps. Using a charged particle beam, signals are collected while scanning the structure to obtain an image indicative of various fabrication steps. Schwarzband's method involves processing this image to determine specific parameters of the structure, allowing for individual measurement of fabrication steps.
Career Highlights:
Ishai Schwarzband has made significant contributions throughout his career, helping shape the future of semiconductor fabrication technologies. His pivotal role at Applied Materials Israel Limited has resulted in numerous advancements and successful projects.
Collaborations:
Innovation thrives through collaboration, and Schwarzband has had the pleasure of working alongside talented individuals in the field. Two notable co-workers include Roman Kris and Yakov Weinberg. Their combined expertise has undoubtedly contributed to the success of their projects and patent applications.
Conclusion:
Ishai Schwarzband's exceptional talent and dedication to precision measurements in semiconductor fabrication are evident through his impressive portfolio of 24 patents. With his latest patents in critical dimension variation determination and 3D-NAND CDSEM metrology, Schwarzband continues to push the boundaries of what is possible in the industry. Collaborating with esteemed professionals and working at Applied Materials Israel Limited, he remains at the forefront of innovation, shaping the future of semiconductor fabrication technologies.