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For the Inventor, By the Inventor

Yokohama, Japan

Akira Hamamatsu

This inventor holds 84 USPTO granted patents and 4 published patent applications, primarily in Defect Inspection Technology (CPC class G01N21-9501). Top assignees: Hitachi-High-Technologies Corporation, Hitachi, Ltd., Hitachi High-Tech Electronics Engineering Co., Ltd.. Active years: 2001-2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Akira Hamamatsu. Retrieved from https://idiyas.com/inventor/akira-hamamatsu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 84 

% Patents Active = 41.7

Average Co-Inventor Count = 4.9

ph-index = 12

Forward Citations = 505(Granted Patents)

Forward Citations (Not Self Cited) = 399(Dec 10, 2025)


Inventors with similar research interests:

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Location History:

  • Chiba, JP (2012 - 2014)
  • Mito, JP (2016)
  • Yokohama, JP (2001 - 2019)
  • Tokyo, JP (2004 - 2022)

Company Filing History:

goldMedal72 out of 2,874 
 
Hitachi-High-Technologies Corporation
 patents
silverMedal17 out of 42,731 
 
Hitachi, Ltd.
 patents
bronzeMedal4 out of 14 
 
Hitachi High-Tech Electronics Engineering Co., Ltd.
 patents
4. 2 out of 1,386 
 
Hitachi High-Tech Corporation
 patents
5. 1 out of 88 
 
Hitachi Electronics Engineering Co., Ltd.
 patents
6. 1 out of 1 
 
Hitachi High-Electronics Corporation
 patent
7. 1 out of 2,816 
 
Minolta Company, Ltd.
 patents
8. 1 out of 834,513 
Other
 patents
where one patent can have more than one assignee

Years Active: 2001-2022

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Areas of Expertise:
Defect Classification
Inspection Device
Examination Device
Defect Inspection Method
Semiconductor Inspection
Shape Measurement
Defect Inspecting Apparatus
Pattern Defects
Surface Inspection
Defect Detection
Apparatus Method
Specimen Inspection
84 patents (USPTO):Explore Patents
1. 11442024 - Defect classification device, inspection device, and inspection system (2022-09-13),
2. 11346791 - Inspection device and inspection method thereof (2022-05-31),
3. 11143600 - Defect inspection device (2021-10-12),
4. 10401304 - Examination device (2019-09-03),
5. 10261027 - Inspection device (2019-04-16),
6. 10254235 - Defect inspecting method and defect inspecting apparatus (2019-04-09),
7. 10107762 - Examination device (2018-10-23),
8. 9841384 - Defect inspecting method and defect inspecting apparatus (2017-12-12),
9. 9645094 - Defect inspection device and defect inspection method (2017-05-09),
10. 9588055 - Defect inspection apparatus and defect inspection method (2017-03-07),
11. 9568439 - Defect inspection device and defect inspection method (2017-02-14),
12. 9568437 - Inspection device (2017-02-14),
13. 9354049 - Shape measurement method, and system therefor (2016-05-31),
14. 9329136 - Defect inspection device and defect inspection method (2016-05-03),
15. 9228960 - Defect inspecting method and defect inspecting apparatus (2016-01-05),

Title: The Innovative Journey of Akira Hamamatsu

Introduction: Akira Hamamatsu, a pioneering inventor hailing from Yokohama, Japan, has made significant contributions to the field of technology with her groundbreaking innovations.

Latest Patents: Akira Hamamatsu's latest patents focus on advancements in optical technology, particularly in the development of high-performance imaging devices for various applications.

Career Highlights: With a career spanning over two decades, Akira Hamamatsu has established herself as a leading figure in the tech industry, known for her expertise in photonics and sensor technologies. Her inventions have revolutionized the way we perceive and interact with the world around us.

Collaborations: Throughout her career, Akira Hamamatsu has collaborated with top research institutions, universities, and tech companies to further enhance her inventions and bring them to the market. Her collaborative efforts have led to the creation of cutting-edge products that have had a lasting impact on the industry.

Conclusion: Akira Hamamatsu's relentless pursuit of innovation and her passion for pushing the boundaries of technology have solidified her reputation as a visionary inventor. Her contributions continue to inspire future generations of inventors and shape the technological landscape for years to come.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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