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For the Inventor, By the Inventor

Tokyo, Japan

Hitachi-High-Technologies Corporation

Calculating rank
USPTO Granted Patents = 2,874

% Expired Patents = 33.2



Trademarks = 10

Forward Citations = 17,076

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1,932 inventors (with patents filed for the assignee):

goldMedal Mitsuru Oonuma (93 out of 106 patents)

silverMedal Toshifumi Honda (80 out of 114 patents)

bronzeMedal Mitsugu Sato (75 out of 128 patents)

4.  Shunji Maeda (73 out of 168 patents)

5.  Akira Hamamatsu (72 out of 84 patents)

6.  Hidetoshi Nishiyama (70 out of 109 patents)

7.  Yuta Urano (66 out of 80 patents)

8.  Minori Noguchi (60 out of 113 patents)

9.  Takahiro Jingu (58 out of 66 patents)

10.  Hidetoshi Morokuma (58 out of 73 patents)

11.  Muneyuki Fukuda (54 out of 97 patents)

12.  Takehiro Hirai (51 out of 66 patents)

13.  Hiroki Kawada (50 out of 61 patents)

14.  Hiroyuki Noda (49 out of 69 patents)

15.  Shigeru Matsui (48 out of 84 patents)


Core Competencies:
Charged Particle Beam
Automated Analyzer
Defect Detection
Electron Microscope
Pattern Measurement
Plasma Processing
Biochemical Analyzer
Far-Infrared Spectroscopy
Ion Beam Device
Mass Spectrometer
Height Measurement
Sample Observation

2,874 patents:

1. 12174551 - Pattern measurement device and pattern measurement method (2024-12-24),
2. 11959735 - Height measuring device and beam irradiation device (2024-04-16),
3. 11933800 - Automated analyzing device (2024-03-19),
4. 11879904 - Method of washing an aspiration probe of an in-vitro diagnostic system, in-vitro diagnostic method, and in-vitro diagnostic system (2024-01-23),
5. 11791124 - Charged particle beam apparatus (2023-10-17),
6. 11784023 - Charged particle beam apparatus (2023-10-10),
7. 11662357 - Automated analysis device (2023-05-30),
8. 11656219 - Apparatus and method for storing thin film device and method for measuring biological molecule (2023-05-23),
9. 11640897 - Charged particle beam device (2023-05-02),
10. 11619639 - Automated analyzer (2023-04-04),
11. 11442024 - Defect classification device, inspection device, and inspection system (2022-09-13),
12. 11430630 - Charged particle beam apparatus (2022-08-30),
13. 11418101 - Linear motor for vacuum and vacuum processing apparatus (2022-08-16),
14. 11402397 - Automatic analyzer (2022-08-02),
15. 11360047 - Capillary electrophoresis device (2022-06-14),
Company Overview
Hitachi-High-Technologies Corporation, based in Tokyo, specializes in advanced charged particle beam technology. The company develops and manufactures a range of sophisticated instruments, including electron microscopes and automated analyzers, which are pivotal in defect detection and pattern measurement. Their expertise extends to plasma processing and biochemical analysis, contributing significantly to various sectors such as materials science and life sciences. Hitachi-High-Tech's innovations support research and industrial applications globally.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Nov 3 2026

Hitachi-High-Technologies Corporation USPTO Patent Assignee Logo
2,874 Patents

#43 in Tokyo

#86 in Japan

#333 in the World

Tokyo, JP
Tokyo, Japan

Hitachi-High-Technologies Corporation

Forward Citations = 17,076

1,932 inventors:

goldMedal Mitsuru Oonuma (93 out of 106 patents)

silverMedal Toshifumi Honda (80 out of 114 patents)

bronzeMedal Mitsugu Sato (75 out of 128 patents)

4.  Shunji Maeda (73 out of 168 patents)

5.  Akira Hamamatsu (72 out of 84 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Hitachi-High-Technologies Corporation. Retrieved from https://idiyas.com/company/hitachi-high-technologies

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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